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Advanced mathematical and computatio...

Pavese, Franco.

Advanced mathematical and computational tools in metrology and testing X

紀錄類型:	書目-電子資源 : Monograph/item
正題名/作者:	Advanced mathematical and computational tools in metrology and testing Xeditors, F. Pavese ... [et al.].
其他作者:	Pavese, Franco.
出版者:	Singapore :World Scientific,c2015.
面頁冊數:	1 online resource (xi, 429 p.) :ill. (some col.)
附註:	Title from PDF title page (viewed June 15, 2015)
標題:	Metrology.
電子資源:	http://www.worldscientific.com/worldscibooks/10.1142/9610#t=toc
ISBN:	9789814678629$q(electronic bk.)

Advanced mathematical and computational tools in metrology and testing X
Advanced mathematical and computational tools in metrology and testing X[electronic resource] /editors, F. Pavese ... [et al.]. - 1st ed. - Singapore :World Scientific,c2015. - 1 online resource (xi, 429 p.) :ill. (some col.) - Series on advances in mathematics for applied sciences ;v. 86. - Series on advances in mathematics for applied sciences ;v. 83..

Title from PDF title page (viewed June 15, 2015)

Includes bibliographical references and indexes.

"This volume contains original and refereed contributions from the tenth AMCTM Conference (http://www.nviim.ru/AMCTM2014) held in St. Petersburg (Russia) in September 2014 on the theme of advanced mathematical and computational tools in metrology and testing. The themes in this volume reflect the importance of the mathematical, statistical and numerical tools and techniques in metrology and testing and, also keeping the challenge promoted by the Metre Convention, to access a mutual recognition for the measurement standards."--Provided by publisher.

Electronic reproduction.
Singapore :
World Scientific,
[2015].

Mode of access: World Wide Web.

System requirements: Adobe Acrobat Reader required to view PDF file.

ISBN: 9789814678629$q(electronic bk.)

LCCN: 2015008632Subjects--Topical Terms:

486307
Metrology.

LC Class. No.: QC88 / .A38 2015

Dewey Class. No.: 389.1015195

Advanced mathematical and computational tools in metrology and testing X
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490 1 $a Series on advances in mathematics for applied sciences ; $v v. 86
500 $a Title from PDF title page (viewed June 15, 2015)
504 $a Includes bibliographical references and indexes.
520 $a "This volume contains original and refereed contributions from the tenth AMCTM Conference (http://www.nviim.ru/AMCTM2014) held in St. Petersburg (Russia) in September 2014 on the theme of advanced mathematical and computational tools in metrology and testing. The themes in this volume reflect the importance of the mathematical, statistical and numerical tools and techniques in metrology and testing and, also keeping the challenge promoted by the Metre Convention, to access a mutual recognition for the measurement standards."--Provided by publisher.
533 $a Electronic reproduction. $b Singapore : $c World Scientific, $d [2015]. $n Mode of access: World Wide Web.
538 $a System requirements: Adobe Acrobat Reader required to view PDF file.
538 $a Mode of access: World Wide Web.
588 $a Description based on print version record.
650 0 $a Metrology. $3 486307
650 0 $a Statistics. $3 182057
700 1 $a Pavese, Franco. $3 647901
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856 4 0 $u http://www.worldscientific.com/worldscibooks/10.1142/9610#t=toc