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Fringe pattern analysis for optical ...

Padilla, J. Moisés

Fringe pattern analysis for optical metrologytheory, algorithms, and applications /

紀錄類型:	書目-電子資源 : Monograph/item
正題名/作者:	Fringe pattern analysis for optical metrologyManuel Servin, J. Antonio Quiroga, and J. Moisés Padilla.
其他題名:	theory, algorithms, and applications /
作者:	Servin, Manuel.
其他作者:	Quiroga, J. Antonio
出版者:	Weinheim :Wiley-VCH,2014.
面頁冊數:	1 online resource (xvi, 328 p.) :ill.
標題:	Interferometry.
電子資源:	http://onlinelibrary.wiley.com/book/10.1002/9783527681075
ISBN:	1306840880$q(electronic bk.)

Fringe pattern analysis for optical metrologytheory, algorithms, and applications /
Servin, Manuel.

Fringe pattern analysis for optical metrologytheory, algorithms, and applications /[electronic resource] :Manuel Servin, J. Antonio Quiroga, and J. Moisés Padilla. - 1st ed. - Weinheim :Wiley-VCH,2014. - 1 online resource (xvi, 328 p.) :ill.

Includes bibliographical references and index.

ISBN: 1306840880$q(electronic bk.)Subjects--Topical Terms:

211537
Interferometry.

LC Class. No.: QC39 / .S384 2014

Dewey Class. No.: 530.8

Fringe pattern analysis for optical metrologytheory, algorithms, and applications /
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100 1 $a Servin, Manuel. $3 723183
245 1 0 $a Fringe pattern analysis for optical metrology $h [electronic resource] : $b theory, algorithms, and applications / $c Manuel Servin, J. Antonio Quiroga, and J. Moisés Padilla.
250 $a 1st ed.
260 $a Weinheim : $b Wiley-VCH, $c 2014.
300 $a 1 online resource (xvi, 328 p.) : $b ill.
504 $a Includes bibliographical references and index.
588 0 $a Online resource; title from PDF title page (Wiley, viewed August 1, 2014).
650 0 $a Interferometry. $3 211537
650 0 $a Diffraction patterns. $3 340136
650 0 $a Optical measurements. $3 207767
700 1 $a Quiroga, J. Antonio $q (Juan Antonio) $3 723184
700 1 $a Padilla, J. Moisés $q (José Moisés) $3 723185
856 4 0 $u http://onlinelibrary.wiley.com/book/10.1002/9783527681075