國立高雄大學圖資館 |

語系: 繁體中文

說明(常見問題)

圖資館首頁

登入

回首頁 到查詢結果 [ subject:"Smart materials" ]

切換: 標籤 | MARC模式 | ISBD

Defects in advanced electronic mater...

Buyanova, Irina,

Defects in advanced electronic materials and novel low dimensional structures /

紀錄類型:	書目-電子資源 : Monograph/item
正題名/作者:	Defects in advanced electronic materials and novel low dimensional structures /edited by Jan Stehr, Irina Buyanova, Weimin Chen.
其他作者:	Chen, Weimin,
面頁冊數:	1 online resource.
標題:	Smart materialsDefects.
電子資源:	https://www.sciencedirect.com/science/book/9780081020531
ISBN:	9780081020548$q(electronic bk.)

Defects in advanced electronic materials and novel low dimensional structures /
Defects in advanced electronic materials and novel low dimensional structures /edited by Jan Stehr, Irina Buyanova, Weimin Chen. - 1 online resource. - Woodhead Publishing series in electronic and optical materials. - Woodhead Publishing series in electronic and optical materials..

Includes bibliographical references and index.

"Defects in Advanced Electronic Materials and Novel Low Dimensional Structures provides a comprehensive review on the recent progress in solving defect issues and deliberate defect engineering in novel material systems. It begins with an overview of point defects in ZnO and group-III nitrides, including irradiation-induced defects, and then look at defects in one and two-dimensional materials, including carbon nanotubes and graphene. Next, it examines the ways that defects can expand the potential applications of semiconductors, such as energy upconversion and quantum processing. The book concludes with a look at the latest advances in theory. While defect physics is extensively reviewed for conventional bulk semiconductors, the same is far from being true for novel material systems, such as low-dimensional 1D and 0D nanostructures and 2D monolayers. This book fills that necessary gap.Presents an in-depth overview of both conventional bulk semiconductors and low-dimensional, novel material systems, such as 1D structures and 2D monolayersAddresses a range of defects in a variety of systems, providing a comparative approachIncludes sections on advances in theory that provide insights on where this body of research might lead"--

ISBN: 9780081020548$q(electronic bk.)

Nat. Bib. No.: GBB890521bnbSubjects--Topical Terms:

839571
Smart materials
--Defects.Index Terms--Genre/Form:

214472
Electronic books.

LC Class. No.: TA418.9.S62

Dewey Class. No.: 620.11

Defects in advanced electronic materials and novel low dimensional structures /
LDR:02496nmm a2200313 i 4500 001 557080
006 m o d
007 cr cnu|unuuu||
008 191128s2018 enk ob 001 0 eng d
015 $a GBB890521 $2 bnb
020 $a 9780081020548$q(electronic bk.)
020 $a 0081020546$q(electronic bk.)
020 $a 9780081020531
020 $a 0081020538
035 $a (OCoLC)1041152761 $z (OCoLC)1041884225 $z (OCoLC)1042476094
035 $a els19100082
040 $a N $b eng $e rda $e pn $c N $d N $d YDX $d OPELS $d OTZ $d MERER $d NLE $d UPM $d UKMGB $d U3W $d OCLCQ $d LVT $d D6H
041 0 $a eng
050 4 $a TA418.9.S62
082 0 4 $a 620.11 $2 23
245 0 0 $a Defects in advanced electronic materials and novel low dimensional structures / $c edited by Jan Stehr, Irina Buyanova, Weimin Chen.
264 1 $a Duxford, United Kingdom : $b Woodhead Publishing, an imprint of Elsevier, $c 2018.
300 $a 1 online resource.
336 $a text $b txt $2 rdacontent
337 $a computer $b c $2 rdamedia
338 $a online resource $b cr $2 rdacarrier
490 1 $a Woodhead Publishing series in electronic and optical materials
504 $a Includes bibliographical references and index.
520 $a "Defects in Advanced Electronic Materials and Novel Low Dimensional Structures provides a comprehensive review on the recent progress in solving defect issues and deliberate defect engineering in novel material systems. It begins with an overview of point defects in ZnO and group-III nitrides, including irradiation-induced defects, and then look at defects in one and two-dimensional materials, including carbon nanotubes and graphene. Next, it examines the ways that defects can expand the potential applications of semiconductors, such as energy upconversion and quantum processing. The book concludes with a look at the latest advances in theory. While defect physics is extensively reviewed for conventional bulk semiconductors, the same is far from being true for novel material systems, such as low-dimensional 1D and 0D nanostructures and 2D monolayers. This book fills that necessary gap.Presents an in-depth overview of both conventional bulk semiconductors and low-dimensional, novel material systems, such as 1D structures and 2D monolayersAddresses a range of defects in a variety of systems, providing a comparative approachIncludes sections on advances in theory that provide insights on where this body of research might lead"-- $c Provided by publisher.
650 0 $a Smart materials $x Defects. $3 839571
650 0 $a Nanostructured materials $x Defects. $3 696127
655 4 $a Electronic books. $2 local. $3 214472
700 1 $a Chen, Weimin, $e editor. $3 839568
700 1 $a Stehr, Jan, $e editor. $3 839569
700 1 $a Buyanova, Irina, $e editor. $3 839570
830 0 $a Woodhead Publishing series in electronic and optical materials. $3 696111
856 4 0 $u https://www.sciencedirect.com/science/book/9780081020531