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[ subject:"Very high speed integrated circuits" ]
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Efficient test methodologies for hig...
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Cheng, Kwang-Ting.
Efficient test methodologies for high-speed serial links
紀錄類型:
書目-電子資源 : Monograph/item
正題名/作者:
Efficient test methodologies for high-speed serial linksby Dongwoo Hong, Kwang-Ting Cheng.
作者:
Hong, Dongwoo.
其他作者:
Cheng, Kwang-Ting.
出版者:
Dordrecht :Springer Science+Business Media B.V.,2010.
面頁冊數:
xi, 98 p. :ill., digital ;25 cm.
叢書名:
Lecture notes in electrical engineering,
Contained By:
Springer eBooks
標題:
Very high speed integrated circuitsTesting.
電子資源:
http://dx.doi.org/10.1007/978-90-481-3443-4
ISBN:
9789048134434 (electronic bk.)
Efficient test methodologies for high-speed serial links
Hong, Dongwoo.
Efficient test methodologies for high-speed serial links
[electronic resource] /by Dongwoo Hong, Kwang-Ting Cheng. - Dordrecht :Springer Science+Business Media B.V.,2010. - xi, 98 p. :ill., digital ;25 cm. - Lecture notes in electrical engineering,v.511876-1100 ;.
ISBN: 9789048134434 (electronic bk.)Subjects--Topical Terms:
485458
Very high speed integrated circuits
--Testing.
LC Class. No.: TK7874.7 / .H66 2010
Dewey Class. No.: 621.381548
Efficient test methodologies for high-speed serial links
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