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Principles and applications of powde...
~
Bhuvanesh, Nattamai.
Principles and applications of powder diffraction /
紀錄類型:
書目-語言資料,印刷品 : Monograph/item
正題名/作者:
Principles and applications of powder diffraction /edited by Abraham Clearfield, Joseph H. Reibenspies, Nattamai Bhuvanesh.
其他作者:
Bhuvanesh, Nattamai.
出版者:
Chichester, UK ;John Wiley and Sons, Ltd.,2008.
面頁冊數:
x, 386 p. :ill. ;25 cm.
標題:
X-raysDiffraction
ISBN:
9781405162227 (hbk. : alk. paper) :
Principles and applications of powder diffraction /
Principles and applications of powder diffraction /
edited by Abraham Clearfield, Joseph H. Reibenspies, Nattamai Bhuvanesh. - 1st ed. - Chichester, UK ;John Wiley and Sons, Ltd.,2008. - x, 386 p. :ill. ;25 cm.
Includes bibliographical references and index.
An overview of powder diffraction / Lachlan M. D. Cranswick -- Intorduction to diffraction / Abraham Clearfield -- Practical aspects / Joseph H. Reibenspies and Nattamai Bhuvanesh -- Profile analysis / Arnt Kern -- Introduction to non-laboratory radiation sources / Peter J. Chupas and Karena W. Chapman -- Phase identification and quantitative methods / Pamela Whitfield and Lyndon Mitchell -- Structure solution / Armel Le Bail -- Structure refinement / James A. Kaduk -- Other topics / E. Andrew Payzant.
ISBN: 9781405162227 (hbk. : alk. paper) :NT$4721
LCCN: 2008002548Subjects--Topical Terms:
338493
X-rays
--Diffraction
LC Class. No.: QC482.D5 / P957 2008
Dewey Class. No.: 548/.83
Principles and applications of powder diffraction /
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An overview of powder diffraction / Lachlan M. D. Cranswick -- Intorduction to diffraction / Abraham Clearfield -- Practical aspects / Joseph H. Reibenspies and Nattamai Bhuvanesh -- Profile analysis / Arnt Kern -- Introduction to non-laboratory radiation sources / Peter J. Chupas and Karena W. Chapman -- Phase identification and quantitative methods / Pamela Whitfield and Lyndon Mitchell -- Structure solution / Armel Le Bail -- Structure refinement / James A. Kaduk -- Other topics / E. Andrew Payzant.
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