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Search result for [ subject:"Circuits int�egr�es �a tr�es grande �echelle"]

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- VLSI test principles and architecturesdesign for testability /
- by: Wang, Laung-Terng.; Wen, Xiaoqing.; Wu, Cheng-Wen, (EE Ph. D.)
- Electronic resources : Monograph/item
- Publisher: Elsevier Morgan Kaufmann Publishers,
- Place of Publication: Boston :
- Year of Publication: 2006
- ISBN: 0080474799; 0123705975; 6610966842; 9780080474793; 9780123705976; 9786610966844
- Availability: 1 Copie(s) available | 1 Copie(s) available for loan
- based on 0 review(s)

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