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Frontiers in electronic testing
書目資訊
Efficient branch and bound search wi...
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Bushnell, Michael L. (1950-)
Efficient branch and bound search with application to computer-aided design /
by:
Bushnell, Michael L. (1950-)
From contamination to defects, fault...
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Khare, Jitendra B.
From contamination to defects, faults, and yield loss :simulation and applications /
by:
Khare, Jitendra B.
Multi-chip module test strategies /
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Zorian, Yervant.
Multi-chip module test strategies /
by:
Zorian, Yervant.
Testability concepts for digital ICs...
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Beenker, F. P. M.
Testability concepts for digital ICs :the macro test approach /
by:
Beenker, F. P. M.
Testing and testable design of high-...
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Chakraborty, Kanad.
Testing and testable design of high-density random-access memories /
by:
Chakraborty, Kanad.
Advances in electronic testing :chal...
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Gizopoulos, Dimitris.
Advances in electronic testing :challenges and methodologies /
by:
Gizopoulos, Dimitris.
Timing performance of nanometer digi...
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Champac, Victor.
Timing performance of nanometer digital circuits under process variations
by:
Champac, Victor.
Soft errors in modern electronic systems
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Nicolaidis, Michael.
Soft errors in modern electronic systems
by:
Nicolaidis, Michael.
A designer's guide to built-in self-test
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SpringerLink (Online service)
A designer's guide to built-in self-test
by:
SpringerLink (Online service)
Essentials of electronic testing for digital, memory, and mixed-signal VLSI circuits
by:
Agrawal, Vishwani D.
Boundary-scan interconnect diagnosis
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Cheung, Peter Y. K.
Boundary-scan interconnect diagnosis
by:
Cheung, Peter Y. K.
Models in hardware testinglecture no...
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SpringerLink (Online service)
Models in hardware testinglecture notes of the forum in honor of Christian Landrault /
by:
SpringerLink (Online service)
Power-constrained testing of VLSI ci...
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Al-Hashimi, Bashir.
Power-constrained testing of VLSI circuits
by:
Al-Hashimi, Bashir.
Verification by error modeling :usin...
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Radecka, Katarzyna.
Verification by error modeling :using testing techniques in hardware verification
by:
Radecka, Katarzyna.
High performance memory testingdesig...
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Adams, R. Dean.
High performance memory testingdesign principles, fault modeling, and self-test /
by:
Adams, R. Dean.
Fault injection techniques and tools...
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Benso, Alfredo.
Fault injection techniques and tools for embedded systems reliability evaluation
by:
Benso, Alfredo.
Emerging Nanotechnologies :Test, Def...
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SpringerLink (Online service)
Emerging Nanotechnologies :Test, Defect Tolerance, and Reliability /
by:
SpringerLink (Online service)
New methods of concurrent checking
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Goessel, M.
New methods of concurrent checking
by:
Goessel, M.
Oscillation-Based Test in Mixed-Sign...
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Sanchez, Gloria Huertas.
Oscillation-Based Test in Mixed-Signal Circuits
by:
Sanchez, Gloria Huertas.
Fault Diagnosis of Analog Integrated Circuits /
by:
Barua, Alok.
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