Frontiers in electronic testing ;

書目資訊

Efficient branch and bound search wi...
Bushnell, Michael L. (1950-)
From contamination to defects, fault...
Khare, Jitendra B.
Multi-chip module test strategies /
Zorian, Yervant.
Testability concepts for digital ICs...
Beenker, F. P. M.
Testing and testable design of high-...
Chakraborty, Kanad.
Advances in electronic testing :chal...
Gizopoulos, Dimitris.
Timing performance of nanometer digi...
Champac, Victor.
Soft errors in modern electronic systems
Nicolaidis, Michael.
A designer's guide to built-in self-test
SpringerLink (Online service)
by: SpringerLink (Online service)
Boundary-scan interconnect diagnosis
Cheung, Peter Y. K.
Models in hardware testinglecture no...
SpringerLink (Online service)
Power-constrained testing of VLSI ci...
Al-Hashimi, Bashir.
Verification by error modeling :usin...
Radecka, Katarzyna.
High performance memory testingdesig...
Adams, R. Dean.
Fault injection techniques and tools...
Benso, Alfredo.
Emerging Nanotechnologies :Test, Def...
SpringerLink (Online service)
New methods of concurrent checking
Goessel, M.
Oscillation-Based Test in Mixed-Sign...
Sanchez, Gloria Huertas.
 
 
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