Random access memory - Testing.

Testing and testable design of high-density random-access memories / by: (Language materials, printed)

Advanced test methods for SRAMseffective solutions for dynamic fault detection in nanoscaled technologies / by: (Electronic resources)

Multi-run memory tests for pattern sensitive faults by: (Electronic resources)

Computer storage devices

Electronics and Microelectronics, Instrumentation.

Computer-Aided Engineering (CAD, CAE) and Design.

Processor Architectures.

Random access memory

Circuits and Systems.

Engineering.

Semiconductor storage devices