Integrated circuits - Very large scale integration - Design.

Overview

Works:	10 works in 4 publications in 4 languages

Titles

VLSI test principles and architectures :design for testability / by: (Language materials, printed)

System-on-chip test architectures :nanometer design for testability / by: (Language materials, printed)

Advanced model order reduction techniques in VLSI design / by: (Language materials, printed)

Advanced model order reduction techniques in VLSI design by: (Electronic resources)

System-on-chip test architecturesnanometer design for testability / by: (Electronic resources)

On and off-chip crosstalk avoidance in VLSI design by: (Electronic resources)

Minimizing and exploiting leakage in VLSI design by: (Electronic resources)

VLSI test principles and architecturesdesign for testability / by: (Electronic resources)

Compact models and performance investigations for subthreshold interconnects by: (Electronic resources)

Learning from VLSI design experience by: (Electronic resources)

Subjects

VLSI.

Crosstalk

COMPUTERS

Testen.