Languages
Lee, Tae-Kyu.
Overview
Works: | 1 works in 1 publications in 1 languages |
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Titles
Fundamentals of lead-free solder interconnect technologyfrom microstructures to reliability /
by:
Lee, Tae-Kyu.; SpringerLink (Online service)
(Electronic resources)
Fatigue damage evolution study with non-destructive magnetic properties measurement method using scanning SQUID microscopy.
by:
Lee, Tae-Kyu.; University of California, Berkeley.
(Electronic resources)