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Testability concepts for digital ICs...

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Beenker, F. P. M.

Testability concepts for digital ICs :the macro test approach /

紀錄類型:	書目-語言資料,印刷品 : Monograph/item
正題名/作者:	Testability concepts for digital ICs :by F.P.M. Beenker, R.G. Bennetts, A.P. Thijssen.
其他題名:	the macro test approach /
作者:	Beenker, F. P. M.
其他作者:	Bennetts, R. G.
出版者:	Boston :Kluwer Academic Publishers,c1995.
面頁冊數:	ix, 212 p. :ill. ;25 cm.
叢書名:	Frontiers in electronic testing
標題:	Automatic checkout equipment.
ISBN:	0792396588 (hardcover : alk. paper) :

Testability concepts for digital ICs :the macro test approach /
Beenker, F. P. M.

Testability concepts for digital ICs :the macro test approach /by F.P.M. Beenker, R.G. Bennetts, A.P. Thijssen. - Boston :Kluwer Academic Publishers,c1995. - ix, 212 p. :ill. ;25 cm. - Frontiers in electronic testing.

Includes bibliographical references (p. 197-205).

ISBN: 0792396588 (hardcover : alk. paper) :NT$3,616

LCCN: 95040166 Subjects--Topical Terms:

185573
Automatic checkout equipment.

LC Class. No.: TK7874.65 / B414 1996

Dewey Class. No.: 621.3815/48

Testability concepts for digital ICs :the macro test approach /
LDR:00662nam 2200181 a 450 001 144553
005 19970109222257.0
008 090528s1995 ne a 000 0 eng
010 $a 95040166
020 $a 0792396588 (hardcover : alk. paper) : $c NT$3,616
035 $a 00005029
040 $a DLC $c DLC $d DLC
050 0 0 $a TK7874.65 $b B414 1996
082 0 0 $2 20 $a 621.3815/48
100 $a Beenker, F. P. M. $q (Frans P. M.) $3 436283
245 1 0 $a Testability concepts for digital ICs : $b the macro test approach / $c by F.P.M. Beenker, R.G. Bennetts, A.P. Thijssen.
260 $a Boston : $a Dordrecht ; $c c1995. $b Kluwer Academic Publishers,
300 $a ix, 212 p. : $b ill. ; $c 25 cm.
440 0 $a Frontiers in electronic testing
504 $a Includes bibliographical references (p. 197-205).
650 $a Automatic checkout equipment. $3 185573
650 $a Digital integrated circuits $x Testing. $3 182402
700 $a Bennetts, R. G. $3 185570
700 $a Thijssen, A. P. $3 185571

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