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Nanoscale characterisation of ferroe...

Alexe, M.

Nanoscale characterisation of ferroelectric materials :scanning probe microscopy approach /

紀錄類型:	書目-語言資料,印刷品 : Monograph/item
正題名/作者:	Nanoscale characterisation of ferroelectric materials :M. Alexe, A. Gruverman, eds.
其他題名:	scanning probe microscopy approach /
其他作者:	Alexe, M.
出版者:	Berlin :Springer-Verlag,c2004.
面頁冊數:	xiii, 282 p. :ill. (some col.) ;24 cm.
叢書名:	Nanoscience and technology
標題:	Nanostructured materials.
ISBN:	3540206620 :

Nanoscale characterisation of ferroelectric materials :scanning probe microscopy approach /
Nanoscale characterisation of ferroelectric materials :scanning probe microscopy approach /M. Alexe, A. Gruverman, eds. - Berlin :Springer-Verlag,c2004. - xiii, 282 p. :ill. (some col.) ;24 cm. - Nanoscience and technology.

Includes bibliographical references and index.

ISBN: 3540206620 :NT$3104

LCCN: 2004040666Subjects--Topical Terms:

216041
Nanostructured materials.

LC Class. No.: TA418.9.N35 / N3445 2004

Dewey Class. No.: 620/.5

Nanoscale characterisation of ferroelectric materials :scanning probe microscopy approach /
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