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Physical principles of electron micr...

Egerton, R. F.

Physical principles of electron microscopy :an introduction to TEM, SEM, and AEM /

紀錄類型:	書目-語言資料,印刷品 : Monograph/item
正題名/作者:	Physical principles of electron microscopy :Ray F. Egerton.
其他題名:	an introduction to TEM, SEM, and AEM /
作者:	Egerton, R. F.
出版者:	New York, NY :Springer,c2005.
面頁冊數:	xii, 202 p. :ill. ;25 cm.
標題:	Electron microscopy.
電子資源:	http://www.loc.gov/catdir/toc/fy0605/2005924717.html

Physical principles of electron microscopy :an introduction to TEM, SEM, and AEM /
Egerton, R. F.

Physical principles of electron microscopy :an introduction to TEM, SEM, and AEM /Ray F. Egerton. - New York, NY :Springer,c2005. - xii, 202 p. :ill. ;25 cm.

Includes bibliographical references (p. [195]-196) and index.

LCCN: 2005924717Subjects--Topical Terms:

189038
Electron microscopy.

LC Class. No.: QH212.E4 / E354 2005

Physical principles of electron microscopy :an introduction to TEM, SEM, and AEM /
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245 1 0 $a Physical principles of electron microscopy : $b an introduction to TEM, SEM, and AEM / $c Ray F. Egerton.
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