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Lifetime Spectroscopy :A Method of Defect Characterization in Silicon for Photovoltaic Applications /

紀錄類型:	書目-電子資源 : Monograph/item
正題名/作者:	Lifetime Spectroscopy :by Stefan Rein.
其他題名:	A Method of Defect Characterization in Silicon for Photovoltaic Applications /
作者:	Rein, Stefan.
出版者:	Berlin, Heidelberg :Springer-Verlag Berlin Heidelberg,2005.
面頁冊數:	v.: digital
叢書名:	Springer Series in Material Science, ;
標題:	Optical materials
電子資源:	http://dx.doi.org/10.1007/3-540-27922-9
ISBN:	9783540253037 (paper)

Lifetime Spectroscopy :A Method of Defect Characterization in Silicon for Photovoltaic Applications /
Rein, Stefan.

Lifetime Spectroscopy :A Method of Defect Characterization in Silicon for Photovoltaic Applications /[electronic resource] :by Stefan Rein. - Berlin, Heidelberg :Springer-Verlag Berlin Heidelberg,2005. - v.: digital - Springer Series in Material Science, ;85,0933-033X ;.

ISBN: 9783540253037 (paper)Subjects--Topical Terms:

252496
Optical materials

LC Class. No.: TK7871.15.S55 / R45 2005

Dewey Class. No.: 537

Lifetime Spectroscopy :A Method of Defect Characterization in Silicon for Photovoltaic Applications /
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