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Emerging Nanotechnologies :Test, Def...

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Emerging Nanotechnologies :Test, Defect Tolerance, and Reliability /

紀錄類型:	書目-電子資源 : Monograph/item
正題名/作者:	Emerging Nanotechnologies :edited by Mohammad Tehranipoor.
其他題名:	Test, Defect Tolerance, and Reliability /
其他作者:	Tehranipoor, Mohammad.
出版者:	Boston, MA :Springer Science+Business Media, LLC,2008.
面頁冊數:	xii, 405 p. :ill., digital ;24 cm.
叢書名:	Frontiers in Electronic Testing, ;
Contained By:	Springer eBooks
標題:	Nanotechnology.
電子資源:	http://dx.doi.org/10.1007/978-0-387-74747-7
ISBN:	9780387747460 (paper)

Emerging Nanotechnologies :Test, Defect Tolerance, and Reliability /
Emerging Nanotechnologies :Test, Defect Tolerance, and Reliability /[electronic resource] :edited by Mohammad Tehranipoor. - Boston, MA :Springer Science+Business Media, LLC,2008. - xii, 405 p. :ill., digital ;24 cm. - Frontiers in Electronic Testing, ;37,0929-1296 ;.

ISBN: 9780387747460 (paper)Subjects--Topical Terms:

193873
Nanotechnology.

LC Class. No.: T174.7 / .E44 2008

Dewey Class. No.: 620.5

Emerging Nanotechnologies :Test, Defect Tolerance, and Reliability /
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