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新式微波雙面校正與量測技術之發展與驗證 = Development an...

國立高雄大學電機工程學系碩士班

新式微波雙面校正與量測技術之發展與驗證 = Development and Verification of Novel Microwave Double-side Calibration and Measurement Technology

紀錄類型:	書目-語言資料,印刷品 : 單行本
並列題名:	Development and Verification of Novel Microwave Double-side Calibration and Measurement Technology
作者:	官聖洧,
其他團體作者:	國立高雄大學
出版地:	[高雄市]
出版者:	撰者;
出版年:	民99[2010]
面頁冊數:	50面圖，表 : 30公分;
標題:	網路分析儀
標題:	VNA
電子資源:	http://handle.ncl.edu.tw/11296/ndltd/11848524809811592572
摘要註:	本論文提出新式微波雙面校正與量測技術並以兩種待測物進行驗證。傳統微波高頻量測技術皆建立於單面校正實行單面量測，本論文將針對常用之短路-開路-負載-穿透(SOLT ;Short-Open-Load-Thru)校正法，修改此校正法之關鍵元件”穿透校正元件”，提出新式雙面校正穿透元件結構設計與驗證，並藉由Ansoft公司HFSS (High Frequency Structure Simulator)軟體模擬其延遲時間，實現雙面校正與量測。第一種驗證用待測物為自動化測試(ATE ;Auto Testing Equipment)中常見之彈簧探針(Spring Probe)，將互相比對傳統模型建立方法與新式雙面量測結果以証明新式校正可達預計之頻寬。第二種待測物為封裝基板之單端傳輸線，此傳輸線於第一層穿越3-2-3架構之封裝基板至最下層，並藉由Ansoft SIwave軟體進行模擬，最後與雙式雙面量測結果比對。 In this thesis, novel microwave double-side calibration and measurement technology is presented and verified with two DUT. Conventional microwave measurement bases on single-side calibration, then the key calibration element of SOLT (Short-Open-Load-Thru) calibration method, thru element, will be modified into novel double-side thru calibration element, and the delay time will be simulated in Ansoft HFSS. Finally, novel double-side calibration and measurement are achieved.The first kind of DUT to verify novel double-side measurement is spring probe, which is commonly used in ATE (Auto Testing Equipment). The comparison between conventional modeling method for spring probe and double-side measurement data will be presented. Second kind of DUT is a trace on package substrate, which is used to transmit from top metal through 3-2-3 stacked up substrate to bottom metal. Then the measured results are compared with the simulation results by Ansoft SIwave and double-side measurement data

新式微波雙面校正與量測技術之發展與驗證 = Development and Verification of Novel Microwave Double-side Calibration and Measurement Technology
官, 聖洧

新式微波雙面校正與量測技術之發展與驗證 = Development and Verification of Novel Microwave Double-side Calibration and Measurement Technology / 官聖洧撰 - [高雄市] : 撰者, 民99[2010]. - 50面 ; 圖，表 ; 30公分.
參考書目：面.
網路分析儀VNA

新式微波雙面校正與量測技術之發展與驗證 = Development and Verification of Novel Microwave Double-side Calibration and Measurement Technology
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328 $a 碩士論文--國立高雄大學電機工程學系碩士班
330 $a 本論文提出新式微波雙面校正與量測技術並以兩種待測物進行驗證。傳統微波高頻量測技術皆建立於單面校正實行單面量測，本論文將針對常用之短路-開路-負載-穿透(SOLT ;Short-Open-Load-Thru)校正法，修改此校正法之關鍵元件”穿透校正元件”，提出新式雙面校正穿透元件結構設計與驗證，並藉由Ansoft公司HFSS (High Frequency Structure Simulator)軟體模擬其延遲時間，實現雙面校正與量測。第一種驗證用待測物為自動化測試(ATE ;Auto Testing Equipment)中常見之彈簧探針(Spring Probe)，將互相比對傳統模型建立方法與新式雙面量測結果以証明新式校正可達預計之頻寬。第二種待測物為封裝基板之單端傳輸線，此傳輸線於第一層穿越3-2-3架構之封裝基板至最下層，並藉由Ansoft SIwave軟體進行模擬，最後與雙式雙面量測結果比對。 In this thesis, novel microwave double-side calibration and measurement technology is presented and verified with two DUT. Conventional microwave measurement bases on single-side calibration, then the key calibration element of SOLT (Short-Open-Load-Thru) calibration method, thru element, will be modified into novel double-side thru calibration element, and the delay time will be simulated in Ansoft HFSS. Finally, novel double-side calibration and measurement are achieved.The first kind of DUT to verify novel double-side measurement is spring probe, which is commonly used in ATE (Auto Testing Equipment). The comparison between conventional modeling method for spring probe and double-side measurement data will be presented. Second kind of DUT is a trace on package substrate, which is used to transmit from top metal through 3-2-3 stacked up substrate to bottom metal. Then the measured results are compared with the simulation results by Ansoft SIwave and double-side measurement data
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