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Broadband reflectometry for enhanced...
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Benedetto, Egidio.
Broadband reflectometry for enhanced diagnostics and monitoring applications
紀錄類型:
書目-電子資源 : Monograph/item
正題名/作者:
Broadband reflectometry for enhanced diagnostics and monitoring applicationsby Andrea Cataldo, Egidio Benedetto, Giuseppe Cannazza.
作者:
Cataldo, Andrea.
其他作者:
Benedetto, Egidio.
出版者:
Berlin, Heidelberg :Springer Berlin Heidelberg,2011.
面頁冊數:
xviii, 148 p. :ill., digital ;24 cm.
叢書名:
Lecture notes in electrical engineering,
Contained By:
Springer eBooks
標題:
Electromagnetic testing.
電子資源:
http://dx.doi.org/10.1007/978-3-642-20233-9
ISBN:
9783642202339 (electronic bk.)
Broadband reflectometry for enhanced diagnostics and monitoring applications
Cataldo, Andrea.
Broadband reflectometry for enhanced diagnostics and monitoring applications
[electronic resource] /by Andrea Cataldo, Egidio Benedetto, Giuseppe Cannazza. - Berlin, Heidelberg :Springer Berlin Heidelberg,2011. - xviii, 148 p. :ill., digital ;24 cm. - Lecture notes in electrical engineering,v.931876-1100 ;.
ISBN: 9783642202339 (electronic bk.)Subjects--Topical Terms:
511693
Electromagnetic testing.
LC Class. No.: TA417.36 / .B76 2011
Dewey Class. No.: 620.1127
Broadband reflectometry for enhanced diagnostics and monitoring applications
LDR
:00897nmm 2200241 a 4500
001
294236
003
Springer
005
20110722114838.0
006
m d
007
cr nn 008maaau
008
110816s2011 gw s j eng d
020
$a
9783642202339 (electronic bk.)
020
$a
9783642202322 (paper)
035
$a
978-3-642-20232-2
050
0 4
$a
TA417.36
$b
.B76 2011
082
0 4
$a
620.1127
$2
22
090
$a
TA417.36
$b
.C357 2011
100
1
$a
Cataldo, Andrea.
$3
511690
245
1 0
$a
Broadband reflectometry for enhanced diagnostics and monitoring applications
$h
[electronic resource] /
$c
by Andrea Cataldo, Egidio Benedetto, Giuseppe Cannazza.
260
$a
Berlin, Heidelberg :
$b
Springer Berlin Heidelberg,
$c
2011.
300
$a
xviii, 148 p. :
$b
ill., digital ;
$c
24 cm.
440
0
$a
Lecture notes in electrical engineering,
$x
1876-1100 ;
$v
v.93
650
0
$a
Electromagnetic testing.
$3
511693
650
0
$a
Nondestructive testing.
$3
224986
650
1 4
$a
Engineering.
$3
210888
650
2 4
$a
Electronics and Microelectronics, Instrumentation.
$3
274412
650
2 4
$a
Microwaves, RF and Optical Engineering.
$3
274186
650
2 4
$a
Measurement Science and Instrumentation.
$3
376366
650
2 4
$a
Optics, Optoelectronics, Plasmonics and Optical Devices.
$3
376501
700
1
$a
Benedetto, Egidio.
$3
511691
700
1
$a
Cannazza, Giuseppe.
$3
511692
710
2
$a
SpringerLink (Online service)
$3
273601
773
0
$t
Springer eBooks
856
4 0
$u
http://dx.doi.org/10.1007/978-3-642-20233-9
950
$a
Engineering (Springer-11647)
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