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VLSI-SoC: Forward-Looking Trends in ...

(1998 :)

VLSI-SoC: Forward-Looking Trends in IC and Systems Design18th IFIP WG 10.5/IEEE International Conference on Very Large Scale Integration, VLSI-SoC 2010, Madrid, Spain, September 27-29, 2010 : revised selected papers /

紀錄類型:	書目-電子資源 : Monograph/item
正題名/作者:	VLSI-SoC: Forward-Looking Trends in IC and Systems Designedited by Jose L. Ayala, David Atienza Alonso, Ricardo Reis.
其他題名:	18th IFIP WG 10.5/IEEE International Conference on Very Large Scale Integration, VLSI-SoC 2010, Madrid, Spain, September 27-29, 2010 : revised selected papers /
其他題名:	VLSI-SoC 2010
其他作者:	Ayala, Jose L.
團體作者:
出版者:	Berlin, Heidelberg :Springer Berlin Heidelberg,2012.
面頁冊數:	x, 353 p. :ill., digital ;24 cm.
Contained By:	Springer eBooks
標題:	Integrated circuitsCongresses.Very large scale integration
電子資源:	http://dx.doi.org/10.1007/978-3-642-28566-0
ISBN:	9783642285660 (electronic bk.)

VLSI-SoC: Forward-Looking Trends in IC and Systems Design18th IFIP WG 10.5/IEEE International Conference on Very Large Scale Integration, VLSI-SoC 2010, Madrid, Spain, September 27-29, 2010 : revised selected papers /
VLSI-SoC: Forward-Looking Trends in IC and Systems Design18th IFIP WG 10.5/IEEE International Conference on Very Large Scale Integration, VLSI-SoC 2010, Madrid, Spain, September 27-29, 2010 : revised selected papers /[electronic resource] :VLSI-SoC 2010edited by Jose L. Ayala, David Atienza Alonso, Ricardo Reis. - Berlin, Heidelberg :Springer Berlin Heidelberg,2012. - x, 353 p. :ill., digital ;24 cm. - IFIP advances in information and communication technology,3731868-4238 ;. - IFIP advances in information and communication technology ;370..

ISBN: 9783642285660 (electronic bk.)Subjects--Topical Terms:

484911
Integrated circuits
--Very large scale integration--Congresses.

LC Class. No.: TK7874.75 / .I35 2010

Dewey Class. No.: 621.395

VLSI-SoC: Forward-Looking Trends in IC and Systems Design18th IFIP WG 10.5/IEEE International Conference on Very Large Scale Integration, VLSI-SoC 2010, Madrid, Spain, September 27-29, 2010 : revised selected papers /
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