國立高雄大學圖資館 |

語系: 繁體中文

登入

回首頁

切換: 標籤 | MARC模式 | ISBD

Photomodulated optical reflectancea ...

Bogdanowicz, Janusz.

Photomodulated optical reflectancea fundamental study aimed at non-destructive carrier profiling in silicon /

紀錄類型:	書目-電子資源 : Monograph/item
正題名/作者:	Photomodulated optical reflectanceby Janusz Bogdanowicz.
其他題名:	a fundamental study aimed at non-destructive carrier profiling in silicon /
作者:	Bogdanowicz, Janusz.
出版者:	Berlin, Heidelberg :Springer Berlin Heidelberg,2012.
面頁冊數:	xxiii, 201 p. :ill., digital ;24 cm.
Contained By:	Springer eBooks
標題:	SemiconductorsTesting
電子資源:	http://dx.doi.org/10.1007/978-3-642-30108-7
ISBN:	9783642301087 (electronic bk.)

Photomodulated optical reflectancea fundamental study aimed at non-destructive carrier profiling in silicon /
Bogdanowicz, Janusz.

Photomodulated optical reflectancea fundamental study aimed at non-destructive carrier profiling in silicon /[electronic resource] :by Janusz Bogdanowicz. - Berlin, Heidelberg :Springer Berlin Heidelberg,2012. - xxiii, 201 p. :ill., digital ;24 cm. - Springer theses,2190-5053. - Springer theses..

ISBN: 9783642301087 (electronic bk.)Subjects--Topical Terms:

567611
Semiconductors
--Testing

LC Class. No.: TK7871.85 / .B64 2012

Dewey Class. No.: 537.6226

Photomodulated optical reflectancea fundamental study aimed at non-destructive carrier profiling in silicon /
LDR:00922nmm a2200265 a 4500 001 340411
003 DE-He213
005 20120807160155.0
006 m d
007 cr nn 008maaau
008 120817s2012 gw s 0 eng d
020 $a 9783642301087 (electronic bk.)
020 $a 9783642301070 (paper)
035 $a 978-3-642-30108-7
040 $a GP $c GP
041 0 $a eng
050 4 $a TK7871.85 $b .B64 2012
082 0 4 $a 537.6226 $2 23
090 $a TK7871.85 $b .B674 2012
100 1 $a Bogdanowicz, Janusz. $3 567610
245 1 0 $a Photomodulated optical reflectance $h [electronic resource] : $b a fundamental study aimed at non-destructive carrier profiling in silicon / $c by Janusz Bogdanowicz.
260 $a Berlin, Heidelberg : $b Springer Berlin Heidelberg, $c 2012.
300 $a xxiii, 201 p. : $b ill., digital ; $c 24 cm.
490 1 $a Springer theses, $x 2190-5053
650 0 $a Semiconductors $x Testing $x Optical methods. $3 567611
650 0 $a Silicon $x Optical properties. $3 224019
650 0 $a Silicon $x Nondestructive testing. $3 567612
650 1 4 $a Physics. $3 179414
650 2 4 $a Semiconductors. $3 182134
650 2 4 $a Applied and Technical Physics. $3 489634
710 2 $a SpringerLink (Online service) $3 273601
773 0 $t Springer eBooks
830 0 $a Springer theses. $3 557607
856 4 0 $u http://dx.doi.org/10.1007/978-3-642-30108-7
950 $a Physics and Astronomy (Springer-11651)