語系:
繁體中文
English
說明(常見問題)
圖資館首頁
登入
回首頁
切換:
標籤
|
MARC模式
|
ISBD
不同磁場條件下成長摻鋁氧化鋅透明導電膜電子與原子結構研究 = Elect...
~
國立高雄大學應用物理學系碩士班
不同磁場條件下成長摻鋁氧化鋅透明導電膜電子與原子結構研究 = Electronic structure of Al-doped ZnO transparent conductive films grown in various magnetic fields studied by x-ray absorption and emission spectroscopies
紀錄類型:
書目-語言資料,印刷品 : 單行本
並列題名:
Electronic structure of Al-doped ZnO transparent conductive films grown in various magnetic fields studied by x-ray absorption and emission spectroscopies
作者:
黃偉豪,
其他團體作者:
國立高雄大學
出版地:
[高雄市]
出版者:
撰者;
出版年:
2011[民100]
面頁冊數:
75葉部份彩圖,表格 : 30公分;
標題:
X光繞射儀
標題:
XRD
電子資源:
http://handle.ncl.edu.tw/11296/ndltd/09573394486881904445
附註:
參考書目:葉69-76
摘要註:
利用脈衝雷射蒸鍍系統在施加一向磁場的條件下將摻鋁氧化鋅(AZO)透明導電薄膜沉積在玻璃基板上,此AZO薄膜製程選用含有2 wt.%氧化鋁之氧化鋅鈀材,並且基板溫度控制在200℃。在成長薄膜樣品過程中,縱向磁場的改變為唯一變因。本論文即是利用XRD、X光吸收近邊緣結構(XANES)、延伸X光吸收精細結構(EXAFS)及X光發射光譜(XES)來研究AZO薄膜在不同磁場製程下的電子、原子結構與其特性間之關聯性。在原子結構方面,經由XRD量測及EXAFS分析,發現樣品之排序性及成長方向性與材料電性有關;而在電子結構量測方面,樣品與光之夾角呈20°,所以藉此我們量測的結果顯示主要為c軸部份之資訊,經由分析O K-,Al K-,Zn L3-及K-edges XANES譜圖和XES譜圖,發現AZO的c軸方向為O terminated,所以於O 2p態密度越多時O的懸鍵也就越多,而O懸鍵的多寡與材料電性有關。 Al-doped ZnO (AZO) transparent conductive thin films have been prepared on glass substrates by laser-produced plasma expanding across a transverse magnetic field. The AZO films were produced by ablating ZnO targets containing 2 wt% Al2O3 and substrates were heated to temperature of 200℃. The magnetic field is adjustable during the sample deposition. X-ray absorption near-edge structure (XANES) and x-ray emission spectroscopy (XES) measurements were used to investigate the electronic structure of AZO thin films and inquire into the influence of the variable magnetic fields. O K-, Al K-, Zn L3-, and K-edges XANES spectra and XES spectra were obtained for AZO thin films with various magnetic fields. The analysis of the XANES spectra showed increased numbers of O 2p states as the resistance decreased. However, Al K-edge XANES spectra revealed the opposite results, implying the enhancement of covalent bond characteristic of Al2O3 along c-axis, the same results also can be corroborated in XES spectra.
不同磁場條件下成長摻鋁氧化鋅透明導電膜電子與原子結構研究 = Electronic structure of Al-doped ZnO transparent conductive films grown in various magnetic fields studied by x-ray absorption and emission spectroscopies
黃, 偉豪
不同磁場條件下成長摻鋁氧化鋅透明導電膜電子與原子結構研究
= Electronic structure of Al-doped ZnO transparent conductive films grown in various magnetic fields studied by x-ray absorption and emission spectroscopies / 黃偉豪撰 - [高雄市] : 撰者, 2011[民100]. - 75葉 ; 部份彩圖,表格 ; 30公分.
參考書目:葉69-76.
X光繞射儀XRD
不同磁場條件下成長摻鋁氧化鋅透明導電膜電子與原子結構研究 = Electronic structure of Al-doped ZnO transparent conductive films grown in various magnetic fields studied by x-ray absorption and emission spectroscopies
LDR
:03305nam0a2200277 450
001
343693
005
20170214090523.0
009
343693
010
0
$b
精裝
010
0
$b
平裝
100
$a
20170214d2011 k y0chiy05 e
101
1
$a
chi
$d
chi
$d
eng
102
$a
tw
105
$a
ak am 000yy
200
1
$a
不同磁場條件下成長摻鋁氧化鋅透明導電膜電子與原子結構研究
$d
Electronic structure of Al-doped ZnO transparent conductive films grown in various magnetic fields studied by x-ray absorption and emission spectroscopies
$z
eng
$f
黃偉豪撰
210
$a
[高雄市]
$c
撰者
$d
2011[民100]
215
0
$a
75葉
$c
部份彩圖,表格
$d
30公分
300
$a
參考書目:葉69-76
314
$a
指導教授:邱昭文博士
328
$a
碩士論文--國立高雄大學應用物理學系碩士班
330
$a
利用脈衝雷射蒸鍍系統在施加一向磁場的條件下將摻鋁氧化鋅(AZO)透明導電薄膜沉積在玻璃基板上,此AZO薄膜製程選用含有2 wt.%氧化鋁之氧化鋅鈀材,並且基板溫度控制在200℃。在成長薄膜樣品過程中,縱向磁場的改變為唯一變因。本論文即是利用XRD、X光吸收近邊緣結構(XANES)、延伸X光吸收精細結構(EXAFS)及X光發射光譜(XES)來研究AZO薄膜在不同磁場製程下的電子、原子結構與其特性間之關聯性。在原子結構方面,經由XRD量測及EXAFS分析,發現樣品之排序性及成長方向性與材料電性有關;而在電子結構量測方面,樣品與光之夾角呈20°,所以藉此我們量測的結果顯示主要為c軸部份之資訊,經由分析O K-,Al K-,Zn L3-及K-edges XANES譜圖和XES譜圖,發現AZO的c軸方向為O terminated,所以於O 2p態密度越多時O的懸鍵也就越多,而O懸鍵的多寡與材料電性有關。 Al-doped ZnO (AZO) transparent conductive thin films have been prepared on glass substrates by laser-produced plasma expanding across a transverse magnetic field. The AZO films were produced by ablating ZnO targets containing 2 wt% Al2O3 and substrates were heated to temperature of 200℃. The magnetic field is adjustable during the sample deposition. X-ray absorption near-edge structure (XANES) and x-ray emission spectroscopy (XES) measurements were used to investigate the electronic structure of AZO thin films and inquire into the influence of the variable magnetic fields. O K-, Al K-, Zn L3-, and K-edges XANES spectra and XES spectra were obtained for AZO thin films with various magnetic fields. The analysis of the XANES spectra showed increased numbers of O 2p states as the resistance decreased. However, Al K-edge XANES spectra revealed the opposite results, implying the enhancement of covalent bond characteristic of Al2O3 along c-axis, the same results also can be corroborated in XES spectra.
510
1
$a
Electronic structure of Al-doped ZnO transparent conductive films grown in various magnetic fields studied by x-ray absorption and emission spectroscopies
$z
eng
610
0
$a
X光繞射儀
$a
X光吸收近邊緣結構
$a
延伸X光吸收精細結構
$a
X光發射譜
610
1
$a
XRD
$a
XANES
$a
EXAFS
$a
XES
681
$a
008M/0019
$b
423203 4420
$v
2007年版
700
1
$a
黃
$b
偉豪
$4
撰
$3
518870
712
0 2
$a
國立高雄大學
$b
應用物理學系碩士班
$3
353956
801
0
$a
tw
$b
NUK
$c
20121016
$g
CCR
856
7
$z
電子資源
$2
http
$u
http://handle.ncl.edu.tw/11296/ndltd/09573394486881904445
筆 0 讀者評論
全部
博碩士論文區(二樓)
館藏
2 筆 • 頁數 1 •
1
條碼號
館藏地
館藏流通類別
資料類型
索書號
使用類型
借閱狀態
預約狀態
備註欄
附件
310002286568
博碩士論文區(二樓)
不外借資料
學位論文
TH 008M/0019 423203 4420 2011
一般使用(Normal)
在架
0
310002286576
博碩士論文區(二樓)
不外借資料
學位論文
TH 008M/0019 423203 4420 2011 c.2
一般使用(Normal)
在架
0
2 筆 • 頁數 1 •
1
多媒體
多媒體檔案
http://handle.ncl.edu.tw/11296/ndltd/09573394486881904445
評論
新增評論
分享你的心得
Export
取書館別
處理中
...
變更密碼
登入