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Structural, syntactic, and statistic...

Robles-Kelly, Antonio.

Structural, syntactic, and statistical pattern recognitionJoint IAPR International Workshop, S+SSPR 2016, Merida, Mexico, November 29 - December 2, 2016 : proceedings /

紀錄類型:	書目-電子資源 : Monograph/item
正題名/作者:	Structural, syntactic, and statistical pattern recognitionedited by Antonio Robles-Kelly ... [et al.].
其他題名:	Joint IAPR International Workshop, S+SSPR 2016, Merida, Mexico, November 29 - December 2, 2016 : proceedings /
其他題名:	S+SSPR 2016
其他作者:	Robles-Kelly, Antonio.
出版者:	Cham :Springer International Publishing :2016.
面頁冊數:	xiii, 588 p. :ill., digital ;24 cm.
Contained By:	Springer eBooks
標題:	Pattern recognition systemsCongresses.
電子資源:	http://dx.doi.org/10.1007/978-3-319-49055-7
ISBN:	9783319490557$q(electronic bk.)

Structural, syntactic, and statistical pattern recognitionJoint IAPR International Workshop, S+SSPR 2016, Merida, Mexico, November 29 - December 2, 2016 : proceedings /
Structural, syntactic, and statistical pattern recognitionJoint IAPR International Workshop, S+SSPR 2016, Merida, Mexico, November 29 - December 2, 2016 : proceedings /[electronic resource] :S+SSPR 2016edited by Antonio Robles-Kelly ... [et al.]. - Cham :Springer International Publishing :2016. - xiii, 588 p. :ill., digital ;24 cm. - Lecture notes in computer science,100290302-9743 ;. - Lecture notes in computer science ;4891..

Dimensionality reduction -- Manifold learning and embedding methods -- Dissimilarity representations -- Graph-theoretic methods -- Model selection, classification and clustering -- Semi and fully supervised learning methods -- Shape analysis -- Spatio-temporal pattern recognition -- Structural matching -- Text and document analysis.

This book constitutes the proceedings of the Joint IAPR International Workshop on Structural Syntactic, and Statistical Pattern Recognition, S+SSPR 2016, consisting of the International Workshop on Structural and Syntactic Pattern Recognition SSPR, and the International Workshop on Statistical Techniques in Pattern Recognition, SPR. The 51 full papers presented were carefully reviewed and selected from 68 submissions. They are organized in the following topical sections: dimensionality reduction, manifold learning and embedding methods; dissimilarity representations; graph-theoretic methods; model selection, classification and clustering; semi and fully supervised learning methods; shape analysis; spatio-temporal pattern recognition; structural matching; text and document analysis.

ISBN: 9783319490557$q(electronic bk.)

Standard No.: 10.1007/978-3-319-49055-7doiSubjects--Topical Terms:

387176
Pattern recognition systems
--Congresses.

LC Class. No.: TK7882.P3

Dewey Class. No.: 006.4

Structural, syntactic, and statistical pattern recognitionJoint IAPR International Workshop, S+SSPR 2016, Merida, Mexico, November 29 - December 2, 2016 : proceedings /
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