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Ultra low noise CMOS image sensors

Boukhayma, Assim.

Ultra low noise CMOS image sensors

紀錄類型:	書目-電子資源 : Monograph/item
正題名/作者:	Ultra low noise CMOS image sensorsby Assim Boukhayma.
作者:	Boukhayma, Assim.
出版者:	Cham :Springer International Publishing :2018.
面頁冊數:	xiv, 180 p. :ill., digital ;24 cm.
Contained By:	Springer eBooks
標題:	Metal oxide semiconductors, Complementary.
電子資源:	http://dx.doi.org/10.1007/978-3-319-68774-2
ISBN:	9783319687742$q(electronic bk.)

Ultra low noise CMOS image sensors
Boukhayma, Assim.

Ultra low noise CMOS image sensors[electronic resource] /by Assim Boukhayma. - Cham :Springer International Publishing :2018. - xiv, 180 p. :ill., digital ;24 cm. - Springer theses,2190-5053. - Springer theses..

Introduction -- Low-Noise CMOS Image Sensors -- Noise Sources and Mechanisms in CIS -- Detailed Noise Analysis in Low-Noise CMOS Image Sensors -- Noise Reduction in CIS Readout Chains -- Design of a Sub-electron Readout Noise Pixel in a Standard CIS Process -- Characterization of a Sub-electron Readout Noise VGA Imager in a Standard CIS Process -- A Passive Switched-Capacitor Circuit For Correlated Multiple Sampling -- Downscaling Effects Towards Photon Counting Capability in CIS -- An Ultra Low Noise CMOS THz Imager -- Conclusion.

This thesis provides a thorough noise analysis for conventional CIS readout chains, while also presenting and discussing a variety of noise reduction techniques that allow the read noise in standard processes to be optimized. Two physical implementations featuring sub-0.5-electron RMS are subsequently presented to verify the proposed noise reduction techniques and provide a full characterization of a VGA imager. Based on the verified noise calculation, the impact of the technology downscaling on the input-referred noise is also studied. Further, the thesis covers THz CMOS image sensors and presents an original design that achieves ultra-low-noise performance. Last but not least, it provides a comprehensive review of CMOS image sensors.

ISBN: 9783319687742$q(electronic bk.)

Standard No.: 10.1007/978-3-319-68774-2doiSubjects--Topical Terms:

184467
Metal oxide semiconductors, Complementary.

LC Class. No.: TK7871.99.M44

Dewey Class. No.: 621.367

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