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Fan-out wafer-level packaging
~
Lau, John H.
Fan-out wafer-level packaging
紀錄類型:
書目-電子資源 : Monograph/item
正題名/作者:
Fan-out wafer-level packagingby John H. Lau.
作者:
Lau, John H.
出版者:
Singapore :Springer Singapore :2018.
面頁冊數:
xx, 303 p. :ill. (some col.), digital ;24 cm.
Contained By:
Springer eBooks
標題:
Chip scale packaging.
電子資源:
http://dx.doi.org/10.1007/978-981-10-8884-1
ISBN:
9789811088841$q(electronic bk.)
Fan-out wafer-level packaging
Lau, John H.
Fan-out wafer-level packaging
[electronic resource] /by John H. Lau. - Singapore :Springer Singapore :2018. - xx, 303 p. :ill. (some col.), digital ;24 cm.
Patent Issues of Fan-out Wafer-Level Packaging -- Flip Chip Technology vs. FOWLP -- Fan-In Wafer-Level Packaging vs. FOWLP -- Embedded Chip Packaging -- FOWLP: Chip-First and Die Face-Down -- FOWLP: Chip-First and Die Face-Up -- FOWLP: Chip-Last or RDL-First -- FOWLP: PoP with FOWLP -- Fan-Out Panel-Level Packaging (FOPLP) -- 3D Integration -- Heterogeneous Integration.
This comprehensive guide to fan-out wafer-level packaging (FOWLP) technology compares FOWLP with flip chip and fan-in wafer-level packaging. It presents the current knowledge on these key enabling technologies for FOWLP, and discusses several packaging technologies for future trends. The Taiwan Semiconductor Manufacturing Company (TSMC) employed their InFO (integrated fan-out) technology in A10, the application processor for Apple's iPhone, in 2016, generating great excitement about FOWLP technology throughout the semiconductor packaging community. For many practicing engineers and managers, as well as scientists and researchers, essential details of FOWLP - such as the temporary bonding and de-bonding of the carrier on a reconstituted wafer/panel, epoxy molding compound (EMC) dispensing, compression molding, Cu revealing, RDL fabrication, solder ball mounting, etc. - are not well understood. Intended to help readers learn the basics of problem-solving methods and understand the trade-offs inherent in making system-level decisions quickly, this book serves as a valuable reference guide for all those faced with the challenging problems created by the ever-increasing interest in FOWLP, helps to remove roadblocks, and accelerates the design, materials, process, and manufacturing development of key enabling technologies for FOWLP.
ISBN: 9789811088841$q(electronic bk.)
Standard No.: 10.1007/978-981-10-8884-1doiSubjects--Topical Terms:
710736
Chip scale packaging.
LC Class. No.: TK7870.17 / .L385 2018
Dewey Class. No.: 621.381046
Fan-out wafer-level packaging
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Patent Issues of Fan-out Wafer-Level Packaging -- Flip Chip Technology vs. FOWLP -- Fan-In Wafer-Level Packaging vs. FOWLP -- Embedded Chip Packaging -- FOWLP: Chip-First and Die Face-Down -- FOWLP: Chip-First and Die Face-Up -- FOWLP: Chip-Last or RDL-First -- FOWLP: PoP with FOWLP -- Fan-Out Panel-Level Packaging (FOPLP) -- 3D Integration -- Heterogeneous Integration.
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