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Kelvin probe force microscopyfrom si...

Glatzel, Thilo.

Kelvin probe force microscopyfrom single charge detection to device characterization /

紀錄類型:	書目-電子資源 : Monograph/item
正題名/作者:	Kelvin probe force microscopyedited by Sascha Sadewasser, Thilo Glatzel.
其他題名:	from single charge detection to device characterization /
其他作者:	Sadewasser, Sascha.
出版者:	Cham :Springer International Publishing :2018.
面頁冊數:	xxiv, 521 p. :ill., digital ;24 cm.
Contained By:	Springer eBooks
標題:	Atomic force microscopy.
電子資源:	http://dx.doi.org/10.1007/978-3-319-75687-5
ISBN:	9783319756875$q(electronic bk.)

Kelvin probe force microscopyfrom single charge detection to device characterization /
Kelvin probe force microscopyfrom single charge detection to device characterization /[electronic resource] :edited by Sascha Sadewasser, Thilo Glatzel. - Cham :Springer International Publishing :2018. - xxiv, 521 p. :ill., digital ;24 cm. - Springer series in surface sciences,v.650931-5195 ;. - Springer series in surface sciences ;48..

Part I: Technical aspects -- Experimental technique and working modes -- Dissipation KPFM -- KPFM techniques for liquid environment -- Open-loop and excitation KPFM -- Quantitative KPFM on semiconductor devices -- KPFM with atomic resolution -- KPFM with atomic resolution -- Part II: Theoretical Aspects -- Local dipoles in atomic and Kelvin probe force microscopy -- Influence of the tip electrostatic field on high resolution KPFM measurements -- Modelling the electrostatic field of a cantilever -- Theory of open-loop KPFM -- KPFM in a SPM simulator -- Electrostatic interactions with dielectric samples -- Part III: Applications -- Kelvin spectroscopy of single molecules -- KPFM for single molecule chemistry -- Optoelectronic properties of single molecules -- Quantitative KPFM of molecular self-assemblies -- Applications of KPFM in liquids -- KPFM of organic solar cell materials -- Correlation of optical and electrical nanoscale properties of organic devices -- KPFM for catalysis -- Quantitative electrical measurements of SiC devices.

This book provides a comprehensive introduction to the methods and variety of Kelvin probe force microscopy, including technical details. It also offers an overview of the recent developments and numerous applications, ranging from semiconductor materials, nanostructures and devices to sub-molecular and atomic scale electrostatics. In the last 25 years, Kelvin probe force microscopy has developed from a specialized technique applied by a few scanning probe microscopy experts into a tool used by numerous research and development groups around the globe. This sequel to the editors' previous volume "Kelvin Probe Force Microscopy: Measuring and Compensating Electrostatic Forces," presents new and complementary topics. It is intended for a broad readership, from undergraduate students to lab technicians and scanning probe microscopy experts who are new to the field.

ISBN: 9783319756875$q(electronic bk.)

Standard No.: 10.1007/978-3-319-75687-5doiSubjects--Topical Terms:

189132
Atomic force microscopy.

LC Class. No.: QH212.A78 / K45 2018

Dewey Class. No.: 502.82

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