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Machine visionautomated visual inspe...

Beyerer, Jurgen.

Machine visionautomated visual inspection : theory, practice and applications /

紀錄類型:	書目-電子資源 : Monograph/item
正題名/作者:	Machine visionby Jurgen Beyerer, Fernando Puente Leon, Christian Frese.
其他題名:	automated visual inspection : theory, practice and applications /
作者:	Beyerer, Jurgen.
其他作者:	Puente Leon, Fernando.
出版者:	Berlin, Heidelberg :Springer Berlin Heidelberg :2016.
面頁冊數:	xx, 798 p. :ill., digital ;24 cm.
Contained By:	Springer eBooks
標題:	Computer vision.
電子資源:	https://doi.org/10.1007/978-3-662-47794-6
ISBN:	9783662477946$q(electronic bk.)

Machine visionautomated visual inspection : theory, practice and applications /
Beyerer, Jurgen.

Machine visionautomated visual inspection : theory, practice and applications /[electronic resource] :by Jurgen Beyerer, Fernando Puente Leon, Christian Frese. - Berlin, Heidelberg :Springer Berlin Heidelberg :2016. - xx, 798 p. :ill., digital ;24 cm.

The book offers a thorough introduction to machine vision. It is organized in two parts. The first part covers the image acquisition, which is the crucial component of most automated visual inspection systems. All important methods are described in great detail and are presented with a reasoned structure. The second part deals with the modeling and processing of image signals and pays particular regard to methods, which are relevant for automated visual inspection.

ISBN: 9783662477946$q(electronic bk.)

Standard No.: 10.1007/978-3-662-47794-6doiSubjects--Topical Terms:

200113
Computer vision.

LC Class. No.: TA1634 / .B49 2016

Dewey Class. No.: 006.37

Machine visionautomated visual inspection : theory, practice and applications /
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520 $a The book offers a thorough introduction to machine vision. It is organized in two parts. The first part covers the image acquisition, which is the crucial component of most automated visual inspection systems. All important methods are described in great detail and are presented with a reasoned structure. The second part deals with the modeling and processing of image signals and pays particular regard to methods, which are relevant for automated visual inspection.
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