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Efficient design of variation-resili...
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Dehaene, Wim.
Efficient design of variation-resilient ultra-low energy digital processors
紀錄類型:
書目-電子資源 : Monograph/item
正題名/作者:
Efficient design of variation-resilient ultra-low energy digital processorsby Hans Reyserhove, Wim Dehaene.
作者:
Reyserhove, Hans.
其他作者:
Dehaene, Wim.
出版者:
Cham :Springer International Publishing :2019.
面頁冊數:
xxiv, 209 p. :ill., digital ;24 cm.
Contained By:
Springer eBooks
標題:
Integrated circuitsDesign and construction.
電子資源:
https://doi.org/10.1007/978-3-030-12485-4
ISBN:
9783030124854$q(electronic bk.)
Efficient design of variation-resilient ultra-low energy digital processors
Reyserhove, Hans.
Efficient design of variation-resilient ultra-low energy digital processors
[electronic resource] /by Hans Reyserhove, Wim Dehaene. - Cham :Springer International Publishing :2019. - xxiv, 209 p. :ill., digital ;24 cm.
Chapter 1. Energy-Efficient Processors: Challenges and Solutions -- Chapter 2. Near-Threshold Operation: Technology, Building Blocks and Architecture -- Chapter 3. Efficient VLSI Design Flow -- Chapter 4. Ultra-Low Voltage Microcontrollers -- Chapter 5. Error Detection and Correction -- Chapter 6. Timing Error-Aware Microcontroller -- Chapter 7. Conclusion.
This book enables readers to achieve ultra-low energy digital system performance. The author's main focus is the energy consumption of microcontroller architectures in digital (sub)-systems. The book covers a broad range of topics extensively: from circuits through design strategy to system architectures. The result is a set of techniques and a context to realize minimum energy digital systems. Several prototype silicon implementations are discussed, which put the proposed techniques to the test. The achieved results demonstrate an extraordinary combination of variation-resilience, high speed performance and ultra-low energy. Presents a full bottom-up micro-electronics approach: circuit-level, design strategy and CAD automation, architecture optimization Motivates discussion with simulation results and/or measurements in an advanced nanometer CMOS process Compares traditional circuit/design/architecture techniques and state-of-the-art, setting the landscape of current best performance and how it can be improved.
ISBN: 9783030124854$q(electronic bk.)
Standard No.: 10.1007/978-3-030-12485-4doiSubjects--Topical Terms:
184690
Integrated circuits
--Design and construction.
LC Class. No.: TK7874 / .R49 2019
Dewey Class. No.: 621.3815
Efficient design of variation-resilient ultra-low energy digital processors
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