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Pattern recognition and computer vis...

(1998 :)

Pattern recognition and computer visionsecond Chinese Conference, PRCV 2019, Xi'an, China, November 8-11, 2019 : proceedings.Part I /

紀錄類型:	書目-電子資源 : Monograph/item
正題名/作者:	Pattern recognition and computer visionedited by Zhouchen Lin ... [et al.].
其他題名:	second Chinese Conference, PRCV 2019, Xi'an, China, November 8-11, 2019 : proceedings.
其他題名:	PRCV 2019
其他作者:	Lin, Zhouchen.
團體作者:
出版者:	Cham :Springer International Publishing :2019.
面頁冊數:	xxx, 629 p. :ill. (some col.), digital ;24 cm.
Contained By:	Springer eBooks
標題:	Pattern recognition systemsCongresses.
電子資源:	https://doi.org/10.1007/978-3-030-31654-9
ISBN:	9783030316549$q(electronic bk.)

Pattern recognition and computer visionsecond Chinese Conference, PRCV 2019, Xi'an, China, November 8-11, 2019 : proceedings.Part I /
Pattern recognition and computer visionsecond Chinese Conference, PRCV 2019, Xi'an, China, November 8-11, 2019 : proceedings.Part I /[electronic resource] :PRCV 2019edited by Zhouchen Lin ... [et al.]. - Cham :Springer International Publishing :2019. - xxx, 629 p. :ill. (some col.), digital ;24 cm. - Lecture notes in computer science,118570302-9743 ;. - Lecture notes in computer science ;4891..

The three-volume set LNCS 11857, 11858, and 11859 constitutes the refereed proceedings of the Second Chinese Conference on Pattern Recognition and Computer Vision, PRCV 2019, held in Xi'an, China, in November 2019. The 165 revised full papers presented were carefully reviewed and selected from 412 submissions. The papers have been organized in the following topical sections: Part I: Object Detection, Tracking and Recognition, Part II: Image/Video Processing and Analysis, Part III: Data Analysis and Optimization.

ISBN: 9783030316549$q(electronic bk.)

Standard No.: 10.1007/978-3-030-31654-9doiSubjects--Topical Terms:

387176
Pattern recognition systems
--Congresses.

LC Class. No.: TK7882.P3 / P73 2019

Dewey Class. No.: 006.4

Pattern recognition and computer visionsecond Chinese Conference, PRCV 2019, Xi'an, China, November 8-11, 2019 : proceedings.Part I /
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