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Reliability, robustness and failure ...

Béchou, Laurent,

Reliability, robustness and failure mechanisms of LED devicesmethodology and evaluation /

紀錄類型:	書目-電子資源 : Monograph/item
正題名/作者:	Reliability, robustness and failure mechanisms of LED devicesYannick Deshayes, Laurent Béchou.
其他題名:	methodology and evaluation /
作者:	Deshayes, Yannick,
其他作者:	Béchou, Laurent,
出版者:	London :ISTE Press, Ltd. ;2016.
面頁冊數:	1 online resource (174 p.).
標題:	Light emitting diodes.
電子資源:	https://www.sciencedirect.com/science/book/9781785481529
ISBN:	9780081010884 (electronic bk.)

Reliability, robustness and failure mechanisms of LED devicesmethodology and evaluation /
Deshayes, Yannick,

Reliability, robustness and failure mechanisms of LED devicesmethodology and evaluation /[electronic resource] :Yannick Deshayes, Laurent Béchou. - London :ISTE Press, Ltd. ;2016. - 1 online resource (174 p.). - Durability, robustness and reliability of photonic devices set. - Durability, robustness and reliability of photonic devices set..

Includes bibliographical references and index.

Front Cover ; Reliability, Robustness and Failure Mechanisms of LED Devices: Methodology and Evaluation ; Copyright; Contents; Preface; Chapter 1. State-of-the-Art of Infrared Technology; 1.1. Introduction; 1.2. Compound materials III-V; 1.3. Light-emitting diodes; 1.4. Applications; 1.5. Conclusion; Chapter 2. Analysis and Models of an LED; 2.1. Introduction; 2.2. Physicochemical analysis; 2.3. Electro-optical analysis; 2.4. Initial characterizations of 935 nm LEDs; 2.5. Conclusion; Chapter 3. Physics of Failure Principles; 3.1. Introduction; 3.2. Aging tests; 3.3. Failure signatures.

ISBN: 9780081010884 (electronic bk.)Subjects--Topical Terms:

219601
Light emitting diodes.
Index Terms--Genre/Form:

214472
Electronic books.

LC Class. No.: TK7871.89.L53

Dewey Class. No.: 621.381522

Reliability, robustness and failure mechanisms of LED devicesmethodology and evaluation /
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260 $a London : $b ISTE Press, Ltd. ; $a Saint Louis : $b Elsevier, $c 2016.
300 $a 1 online resource (174 p.).
490 1 $a Durability, robustness and reliability of photonic devices set
504 $a Includes bibliographical references and index.
505 0 $a Front Cover ; Reliability, Robustness and Failure Mechanisms of LED Devices: Methodology and Evaluation ; Copyright; Contents; Preface; Chapter 1. State-of-the-Art of Infrared Technology; 1.1. Introduction; 1.2. Compound materials III-V; 1.3. Light-emitting diodes; 1.4. Applications; 1.5. Conclusion; Chapter 2. Analysis and Models of an LED; 2.1. Introduction; 2.2. Physicochemical analysis; 2.3. Electro-optical analysis; 2.4. Initial characterizations of 935 nm LEDs; 2.5. Conclusion; Chapter 3. Physics of Failure Principles; 3.1. Introduction; 3.2. Aging tests; 3.3. Failure signatures.
505 8 $a 3.4. Physics of failures3.5. Conclusion; Chapter 4. Methodologies of Reliability Analysis; 4.1. Introduction; 4.2. Method based on the physics of failures; 4.3. Digital methods; 4.4. A new approach; 4.5. Conclusion; Bibliography; Index; Back Cover.
588 0 $a Online resource; title from PDF title page (EBSCO, viewed March 21, 2017).
650 0 $a Light emitting diodes. $3 219601
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700 1 $a Béchou, Laurent, $e author. $3 872406
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