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Structural, syntactic, and statistic...

(1998 :)

Structural, syntactic, and statistical pattern recognitionjoint IAPR International Workshops, S+SSPR 2020, Padua, Italy, January 21-22, 2021 : proceedings /

紀錄類型:	書目-電子資源 : Monograph/item
正題名/作者:	Structural, syntactic, and statistical pattern recognitionedited by Andrea Torsello ... [et al.].
其他題名:	joint IAPR International Workshops, S+SSPR 2020, Padua, Italy, January 21-22, 2021 : proceedings /
其他題名:	S+SSPR 2020
其他作者:	Torsello, Andrea.
團體作者:
出版者:	Cham :Springer International Publishing :2021.
面頁冊數:	xii, 378 p. :ill., digital ;24 cm.
Contained By:	Springer Nature eBook
標題:	Pattern recognition systemsCongresses.
電子資源:	https://doi.org/10.1007/978-3-030-73973-7
ISBN:	9783030739737$q(electronic bk.)

Structural, syntactic, and statistical pattern recognitionjoint IAPR International Workshops, S+SSPR 2020, Padua, Italy, January 21-22, 2021 : proceedings /
Structural, syntactic, and statistical pattern recognitionjoint IAPR International Workshops, S+SSPR 2020, Padua, Italy, January 21-22, 2021 : proceedings /[electronic resource] :S+SSPR 2020edited by Andrea Torsello ... [et al.]. - Cham :Springer International Publishing :2021. - xii, 378 p. :ill., digital ;24 cm. - Lecture notes in computer science,126440302-9743 ;. - Lecture notes in computer science ;4891..

Classification and data processing -- Deep learning -- Graph-theoretic methods -- Multimedia analysis and understanding.

This book constitutes the proceedings of the Joint IAPR International Workshop on Structural, Syntactic, and Statistical Pattern Recognition, S+SSPR 2020, held in Padua, Italy, in January 2021. The 35 papers presented in this volume were carefully reviewed and selected from 81 submissions. The accepted papers cover the major topics of current interest in pattern recognition, including classification and clustering, deep learning, structural matching and graph-theoretic methods, and multimedia analysis and understanding.

ISBN: 9783030739737$q(electronic bk.)

Standard No.: 10.1007/978-3-030-73973-7doiSubjects--Topical Terms:

387176
Pattern recognition systems
--Congresses.

LC Class. No.: TK7882.P3 / I57 2021

Dewey Class. No.: 006.4

Structural, syntactic, and statistical pattern recognitionjoint IAPR International Workshops, S+SSPR 2020, Padua, Italy, January 21-22, 2021 : proceedings /
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