國立高雄大學圖資館 |

登入

回首頁

Development and characterization of a dispersion-encoded method for low-coherence interferometry

紀錄類型:	書目-電子資源 : Monograph/item
正題名/作者:	Development and characterization of a dispersion-encoded method for low-coherence interferometryby Christopher Taudt.
作者:	Taudt, Christopher.
出版者:	Wiesbaden :Springer Fachmedien Wiesbaden :2022.
面頁冊數:	xxiii, 163 p. :ill., digital ;24 cm.
Contained By:	Springer Nature eBook
標題:	Interferometry.
電子資源:	https://doi.org/10.1007/978-3-658-35926-3
ISBN:	9783658359263$q(electronic bk.)

Development and characterization of a dispersion-encoded method for low-coherence interferometry
Taudt, Christopher.

Development and characterization of a dispersion-encoded method for low-coherence interferometry[electronic resource] /by Christopher Taudt. - Wiesbaden :Springer Fachmedien Wiesbaden :2022. - xxiii, 163 p. :ill., digital ;24 cm.

1 Introduction and motivation -- 2 Related works and basic considerations -- 3 Surface profilometry -- 4 Polymer characterization -- 5 Thin-film characterization -- 6 Conclusion.

Open access.

This Open Access book discusses an extension to low-coherence interferometry by dispersion-encoding. The approach is theoretically designed and implemented for applications such as surface profilometry, polymeric cross-linking estimation and the determination of thin-film layer thicknesses. During a characterization, it was shown that an axial measurement range of 79.91 µm with an axial resolution of 0.1 nm is achievable. Simultaneously, profiles of up to 1.5 mm in length were obtained in a scan-free manner. This marked a significant improvement in relation to the state-of-the-art in terms of dynamic range. Also, the axial and lateral measurement range were decoupled partially while functional parameters such as surface roughness were estimated. The characterization of the degree of polymeric cross-linking was performed as a function of the refractive index. It was acquired in a spatially-resolved manner with a resolution of 3.36 x 10-5. This was achieved by the development of a novel mathematical analysis approach. About the Author Christopher Taudt holds a diploma degree in Mechanical Engineering of the WH Zwickau. During a stay at the IT Sligo, Ireland, he earned a Bachelor Degree in Mechanical Engineering. After his studies, Christopher Taudt has worked on research projects in optical metrology and earned a PhD in optical metrology from the TU Dresden.

ISBN: 9783658359263$q(electronic bk.)

Standard No.: 10.1007/978-3-658-35926-3doiSubjects--Topical Terms:

211537
Interferometry.

LC Class. No.: QC411 / .T38 2022

Dewey Class. No.: 535.470287

Development and characterization of a dispersion-encoded method for low-coherence interferometry
LDR:02633nmm a2200349 a 4500 001 618005
003 DE-He213
005 20211116204621.0
006 m d
007 cr nn 008maaau
008 221025s2022 gw s 0 eng d
020 $a 9783658359263$q(electronic bk.)
020 $a 9783658359256$q(paper)
024 7 $a 10.1007/978-3-658-35926-3 $2 doi
035 $a 978-3-658-35926-3
040 $a GP $c GP
041 0 $a eng
050 4 $a QC411 $b .T38 2022
072 7 $a PHJ $2 bicssc
072 7 $a SCI053000 $2 bisacsh
072 7 $a PHJ $2 thema
072 7 $a TTB $2 thema
082 0 4 $a 535.470287 $2 23
090 $a QC411 $b .T224 2022
100 1 $a Taudt, Christopher. $3 917618
245 1 0 $a Development and characterization of a dispersion-encoded method for low-coherence interferometry $h [electronic resource] / $c by Christopher Taudt.
260 $a Wiesbaden : $b Springer Fachmedien Wiesbaden : $b Imprint: Springer Vieweg, $c 2022.
300 $a xxiii, 163 p. : $b ill., digital ; $c 24 cm.
505 0 $a 1 Introduction and motivation -- 2 Related works and basic considerations -- 3 Surface profilometry -- 4 Polymer characterization -- 5 Thin-film characterization -- 6 Conclusion.
506 $a Open access.
520 $a This Open Access book discusses an extension to low-coherence interferometry by dispersion-encoding. The approach is theoretically designed and implemented for applications such as surface profilometry, polymeric cross-linking estimation and the determination of thin-film layer thicknesses. During a characterization, it was shown that an axial measurement range of 79.91 µm with an axial resolution of 0.1 nm is achievable. Simultaneously, profiles of up to 1.5 mm in length were obtained in a scan-free manner. This marked a significant improvement in relation to the state-of-the-art in terms of dynamic range. Also, the axial and lateral measurement range were decoupled partially while functional parameters such as surface roughness were estimated. The characterization of the degree of polymeric cross-linking was performed as a function of the refractive index. It was acquired in a spatially-resolved manner with a resolution of 3.36 x 10-5. This was achieved by the development of a novel mathematical analysis approach. About the Author Christopher Taudt holds a diploma degree in Mechanical Engineering of the WH Zwickau. During a stay at the IT Sligo, Ireland, he earned a Bachelor Degree in Mechanical Engineering. After his studies, Christopher Taudt has worked on research projects in optical metrology and earned a PhD in optical metrology from the TU Dresden.
650 0 $a Interferometry. $3 211537
650 1 4 $a Optics, Lasers, Photonics, Optical Devices. $3 758151
650 2 4 $a Measurement Science and Instrumentation. $3 376366
710 2 $a SpringerLink (Online service) $3 273601
773 0 $t Springer Nature eBook
856 4 0 $u https://doi.org/10.1007/978-3-658-35926-3
950 $a Engineering (SpringerNature-11647)