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Pattern recognition and artificial intelligencethird International Conference, ICPRAI 2022, Paris, France, June 1-3, 2022 : proceedings.Part II /

紀錄類型:	書目-電子資源 : Monograph/item
正題名/作者:	Pattern recognition and artificial intelligenceedited by Mounim El Yacoubi ... [et al.].
其他題名:	third International Conference, ICPRAI 2022, Paris, France, June 1-3, 2022 : proceedings.
其他題名:	ICPRAI 2022
其他作者:	El Yacoubi, Mounim.
團體作者:
出版者:	Cham :Springer International Publishing :2022.
面頁冊數:	xxii, 520 p. :ill. (some col.), digital ;24 cm.
Contained By:	Springer Nature eBook
標題:	Artificial intelligence
電子資源:	https://doi.org/10.1007/978-3-031-09282-4
ISBN:	9783031092824$q(electronic bk.)

Pattern recognition and artificial intelligencethird International Conference, ICPRAI 2022, Paris, France, June 1-3, 2022 : proceedings.Part II /
Pattern recognition and artificial intelligencethird International Conference, ICPRAI 2022, Paris, France, June 1-3, 2022 : proceedings.Part II /[electronic resource] :ICPRAI 2022edited by Mounim El Yacoubi ... [et al.]. - Cham :Springer International Publishing :2022. - xxii, 520 p. :ill. (some col.), digital ;24 cm. - Lecture notes in computer science,133640302-9743 ;. - Lecture notes in computer science ;4891..

This two-volume set constitutes the proceedings of the Third International Conference on Pattern Recognition and Artificial Intelligence, ICPRAI 2022, which took place in Paris, France, in June 2022. The 98 full papers presented were carefully reviewed and selected from 192 submissions. The papers present new advances in the field of pattern recognition and artificial intelligence. They are organized in topical sections as follows: pattern recognition; computer vision; artificial intelligence; big data.

ISBN: 9783031092824$q(electronic bk.)

Standard No.: 10.1007/978-3-031-09282-4doiSubjects--Topical Terms:

252958
Artificial intelligence

LC Class. No.: Q334 / .I58 2022

Dewey Class. No.: 006.3

Pattern recognition and artificial intelligencethird International Conference, ICPRAI 2022, Paris, France, June 1-3, 2022 : proceedings.Part II /
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