Wang, Laung-Terng.
概要
| 作品: | 2 作品在 1 項出版品 1 種語言 | |
|---|---|---|
書目資訊
Electronic design automationsynthesis, verification, and test /
by:
Chang, Yao-Wen.; Cheng, Kwang-Ting, (1961-); ScienceDirect (Online service); Wang, Laung-Terng.
(書目-電子資源)
VLSI test principles and architectures :design for testability /
by:
Wang, Laung-Terng.; Wen, Xiaoqing.; Wu, Cheng-Wen, (EE Ph. D.)
(書目-語言資料,印刷品)
System-on-chip test architecturesnanometer design for testability /
by:
ScienceDirect (Online service); Stroud, Charles E.; Touba, Nur A.; Wang, Laung-Terng.
(書目-電子資源)
VLSI test principles and architecturesdesign for testability /
by:
Wang, Laung-Terng.; Wen, Xiaoqing.; Wu, Cheng-Wen, (EE Ph. D.)
(書目-電子資源)
主題
Electronic circuit design
Circuits int�egr�es �a tr�es grande �echelle
Integrated circuits / Very large scale integration / Testing.
VLSI.
COMPUTERS
Integrated circuits / Very large scale integration / Design.
Computer-aided design.
TECHNOLOGY & ENGINEERING
Circuitos integrados vlsi.
Testen.
Integrated circuits
Systems on a chip