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VLSI test principles and architectures :design for testability /
Record Type:
Language materials, printed : Monograph/item
Title/Author:
VLSI test principles and architectures :edited by Laung-Terng Wang, Cheng-Wen Wu, Xiaoqing Wen.
Reminder of title:
design for testability /
other author:
Wen, Xiaoqing.
Published:
Amsterdam ;Elsevier Morgan Kaufmann Publishers,c2006.
Description:
xxx, 777 p. :ill. ;24 cm.
Series:
The Morgan Kaufmann series in systems on silicon
Subject:
Integrated circuitsVery large scale integration
ISBN:
9780123705976
VLSI test principles and architectures :design for testability /
VLSI test principles and architectures :
design for testability /edited by Laung-Terng Wang, Cheng-Wen Wu, Xiaoqing Wen. - Amsterdam ;Elsevier Morgan Kaufmann Publishers,c2006. - xxx, 777 p. :ill. ;24 cm. - The Morgan Kaufmann series in systems on silicon.
Includes bibliographical references and index.
ISBN: 9780123705976
LCCN: 2006006869Subjects--Topical Terms:
182401
Integrated circuits
--Very large scale integration
LC Class. No.: TK7874.75 / .V871 2006
Dewey Class. No.: 621.39/5
VLSI test principles and architectures :design for testability /
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VLSI test principles and architectures :
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design for testability /
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edited by Laung-Terng Wang, Cheng-Wen Wu, Xiaoqing Wen.
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Amsterdam ;
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Boston :
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c2006.
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Elsevier Morgan Kaufmann Publishers,
300
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xxx, 777 p. :
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ill. ;
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24 cm.
440
4
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The Morgan Kaufmann series in systems on silicon
504
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Includes bibliographical references and index.
650
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Integrated circuits
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Very large scale integration
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Testing.
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182401
650
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Integrated circuits
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Very large scale integration
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Wen, Xiaoqing.
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Wang, Laung-Terng.
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Wu, Cheng-Wen,
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EE Ph. D.
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257761
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西方語文圖書區(四樓)
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1 records • Pages 1 •
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西方語文圖書區(四樓)
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TK7874.75 V871 2006
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