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Demers, Hendrix.

Overview

Works:	1 works in 1 publications in 1 languages

Titles

Field emission scanning electron microscopynew perspectives for materials characterization / by: Brodusch, Nicolas.; Demers, Hendrix.; Gauvin, Raynald.; SpringerLink (Online service) (Electronic resources)

Subjects

Materials Spectroscopy and Microscopy. Materials Science. Scanning electron microscopy. Nanotechnology and Microengineering. Characterization and Evaluation of Materials.

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