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Field emission scanning electron mic...

Brodusch, Nicolas.

Field emission scanning electron microscopynew perspectives for materials characterization /

Record Type:	Electronic resources : Monograph/item
Title/Author:	Field emission scanning electron microscopyby Nicolas Brodusch, Hendrix Demers, Raynald Gauvin.
Reminder of title:	new perspectives for materials characterization /
Author:	Brodusch, Nicolas.
other author:	Demers, Hendrix.
Published:	Singapore :Springer Singapore :2018.
Description:	xii, 137 p. :ill., digital ;24 cm.
Contained By:	Springer eBooks
Subject:	Scanning electron microscopy.
Online resource:	http://dx.doi.org/10.1007/978-981-10-4433-5
ISBN:	9789811044335$q(electronic bk.)

Field emission scanning electron microscopynew perspectives for materials characterization /
Brodusch, Nicolas.

Field emission scanning electron microscopynew perspectives for materials characterization /[electronic resource] :by Nicolas Brodusch, Hendrix Demers, Raynald Gauvin. - Singapore :Springer Singapore :2018. - xii, 137 p. :ill., digital ;24 cm. - SpringerBriefs in applied sciences and technology,2191-530X. - SpringerBriefs in applied sciences and technology..

This book highlights what is now achievable in terms of materials characterization with the new generation of cold-field emission scanning electron microscopes applied to real materials at high spatial resolution. It discusses advanced scanning electron microscopes/scanning- transmission electron microscopes (SEM/STEM), simulation and post-processing techniques at high spatial resolution in the fields of nanomaterials, metallurgy, geology, and more. These microscopes now offer improved performance at very low landing voltage and high -beam probe current stability, combined with a routine transmission mode capability that can compete with the (scanning-) transmission electron microscopes (STEM/-TEM) historically run at higher beam accelerating voltage.

ISBN: 9789811044335$q(electronic bk.)

Standard No.: 10.1007/978-981-10-4433-5doiSubjects--Topical Terms:

242518
Scanning electron microscopy.

LC Class. No.: TA417.23 / .B76 2018

Dewey Class. No.: 502.825

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