利用雷射濺鍍AlN高介電材料於MIS元件結構之光電特性量測研究 = Th...
江秉儒

 

  • 利用雷射濺鍍AlN高介電材料於MIS元件結構之光電特性量測研究 = The Study of the AlN Thin Film Deposition by Excimer Laser Sputtering and Its Characterizations of MIS device
  • Record Type: Language materials, printed : monographic
    Paralel Title: The Study of the AlN Thin Film Deposition by Excimer Laser Sputtering and Its Characterizations of MIS device
    Author: 江秉儒,
    Place of Publication: [高雄市]
    Published: 撰者;
    Year of Publication: 2007[民96]
    Description: [1], 79葉圖,表 : 30公分;
    Subject: 氮化鋁
    Online resource: http://handle.ncl.edu.tw/11296/ndltd/30813816099021423655
    Notes: 指導教授:施明昌
    Notes: 參考書目:葉77-79
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310001514960 博碩士論文區(二樓) 不外借資料 學位論文 008M/0019 542201 3122 2007 一般使用(Normal) On shelf 0
310001514952 博碩士論文區(二樓) 不外借資料 學位論文 008M/0019 542201 3122 2007 c.2 一般使用(Normal) On shelf 0
  • 2 records • Pages 1 •
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