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Digital circuit testing and testabil...

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Lala, Parag K., (1948-)

Digital circuit testing and testability /

Record Type:	Language materials, printed : Monograph/item
Title/Author:	Digital circuit testing and testability /Parag K. Lala.
Author:	Lala, Parag K.,
Published:	San Diego :Academic Press,c1997.
Description:	xii, 199 p. :ill. ;24 cm.
Subject:	Integrated circuitsVery large scale integration
ISBN:	0124343309 :

Digital circuit testing and testability /
Lala, Parag K.,1948-

Digital circuit testing and testability /Parag K. Lala. - San Diego :Academic Press,c1997. - xii, 199 p. :ill. ;24 cm.

Includes bibliographical references and index.

ISBN: 0124343309 :NT$2,742

LCCN: 96042114 Subjects--Topical Terms:

182401
Integrated circuits
--Very large scale integration

LC Class. No.: TK7874.75 / L193 1997

Dewey Class. No.: 621.39/5/0287

Digital circuit testing and testability /
LDR:00521nam 2200169 a 450 001 143371
005 19980520162755.0
008 090528s1997 caua 001 0 eng
010 $a 96042114
020 $a 0124343309 : $c NT$2,742
035 $a 00003836
040 $a DLC $c DLC $d DLC
050 0 0 $a TK7874.75 $b L193 1997
082 0 0 $2 20 $a 621.39/5/0287
100 $a Lala, Parag K., $d 1948- $3 182400
245 1 0 $a Digital circuit testing and testability / $c Parag K. Lala.
260 $a San Diego : $c c1997. $b Academic Press,
300 $a xii, 199 p. : $b ill. ; $c 24 cm.
504 $a Includes bibliographical references and index.
650 $a Integrated circuits $x Very large scale integration $x Testing. $3 182401
650 $a Digital integrated circuits $x Testing. $3 182402
650 $a Integrated circuits $x Fault tolerance. $3 182403

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TK7874.75 L193 1997

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