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Yield and variability optimization o...

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Styblinski, M. A., (1942-)

Yield and variability optimization of integrated circuits /

Record Type:	Language materials, printed : Monograph/item
Title/Author:	Yield and variability optimization of integrated circuits /J.C. Zhang, M.A. Styblinski.
Author:	Zhang, J. C.,
other author:	Styblinski, M. A.,
Published:	Boston :Kluwer Academic Publishers,c1995.
Description:	xv, 234 p. :ill. ;25 cm.
Subject:	Integrated circuitsDesign and construction
ISBN:	0792395514 (acid-free paper) :

Yield and variability optimization of integrated circuits /
Zhang, J. C.,1963-

Yield and variability optimization of integrated circuits /J.C. Zhang, M.A. Styblinski. - Boston :Kluwer Academic Publishers,c1995. - xv, 234 p. :ill. ;25 cm.

Includes bibliographical references (p. 221-231) and index.

ISBN: 0792395514 (acid-free paper) :NT$3,970

LCCN: 94044624 Subjects--Topical Terms:

184557
Integrated circuits
--Design and construction

LC Class. No.: TK7874 / Z63 1995

Dewey Class. No.: 621.3815

Yield and variability optimization of integrated circuits /
LDR:00571nam 2200169 a 450 001 144143
005 19970109005125.0
008 090528s1995 maua 001 0 eng
010 $a 94044624
020 $a 0792395514 (acid-free paper) : $c NT$3,970
035 $a 00004616
040 $a DLC $c DLC $d DLC
050 0 0 $a TK7874 $b Z63 1995
082 0 0 $2 20 $a 621.3815
100 $a Zhang, J. C., $d 1963- $3 184556
245 1 0 $a Yield and variability optimization of integrated circuits / $c J.C. Zhang, M.A. Styblinski.
260 $a Boston : $c c1995. $b Kluwer Academic Publishers,
300 $a xv, 234 p. : $b ill. ; $c 25 cm.
504 $a Includes bibliographical references (p. 221-231) and index.
650 $a Integrated circuits $x Design and construction $x Statistical methods. $3 184557
650 $a Integrated circuits $x Reliability. $3 184558
650 $a Integrated circuits $x Defects. $3 184559
700 $a Styblinski, M. A., $d 1942- $3 184555

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TK7874 Z63 1995

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