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High-level test synthesis of digital...
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Lee, Mike Tien-Chien.
High-level test synthesis of digital VLSI circuits /
Record Type:
Language materials, printed : Monograph/item
Title/Author:
High-level test synthesis of digital VLSI circuits /Mike Tien-Chien Lee.
Author:
Lee, Mike Tien-Chien.
Published:
Boston :Artech House,c1997.
Description:
xi, 220 p. :ill. ;24 cm.
Series:
The Artech House solid-state technology library
Subject:
Integrated circuitsVery large scale integration
ISBN:
0890069077 (alk. paper) :
High-level test synthesis of digital VLSI circuits /
Lee, Mike Tien-Chien.
High-level test synthesis of digital VLSI circuits /
Mike Tien-Chien Lee. - Boston :Artech House,c1997. - xi, 220 p. :ill. ;24 cm. - The Artech House solid-state technology library.
Includes bibliographical references (p. 199-214) and index.
ISBN: 0890069077 (alk. paper) :NT$2,735
LCCN: 96006584 Subjects--Topical Terms:
184578
Integrated circuits
--Very large scale integration
LC Class. No.: TK7874.75 / L479 1997
Dewey Class. No.: 621.39/5
High-level test synthesis of digital VLSI circuits /
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Lee, Mike Tien-Chien.
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High-level test synthesis of digital VLSI circuits /
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Mike Tien-Chien Lee.
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Boston :
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c1997.
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Artech House,
300
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xi, 220 p. :
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ill. ;
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24 cm.
440
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The Artech House solid-state technology library
504
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Includes bibliographical references (p. 199-214) and index.
650
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Integrated circuits
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Very large scale integration
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Computer-aided design.
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184578
650
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Integrated circuits
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Very large scale integration
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Testing
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Data processing
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184579
650
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Digital integrated circuits
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Testing
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Data processing.
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184580
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西方語文圖書區(四樓)
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TK7874.75 L479 1997
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