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Semiconductor measurements and instr...
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Runyan, W. R.
Semiconductor measurements and instrumentation /
Record Type:
Language materials, printed : Monograph/item
Title/Author:
Semiconductor measurements and instrumentation /W.R. Runyan and T.J. Shaffner.
Author:
Runyan, W. R.
other author:
Shaffner, T. J.
Published:
New York :McGraw Hill,c1998.
Description:
x, 453 p. :ill. ;24 cm.
Subject:
Semiconductors.
ISBN:
0070576971 :
Semiconductor measurements and instrumentation /
Runyan, W. R.
Semiconductor measurements and instrumentation /
W.R. Runyan and T.J. Shaffner. - 2nd ed. - New York :McGraw Hill,c1998. - x, 453 p. :ill. ;24 cm.
Includes bibliographical references and index.
ISBN: 0070576971 :NT$2,100
LCCN: 97026081 Subjects--Topical Terms:
182134
Semiconductors.
LC Class. No.: QC611.24 / R943 1998
Dewey Class. No.: 621.3815/2/0287
Semiconductor measurements and instrumentation /
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Semiconductor measurements and instrumentation /
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W.R. Runyan and T.J. Shaffner.
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2nd ed.
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New York :
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c1998.
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McGraw Hill,
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x, 453 p. :
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ill. ;
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24 cm.
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Includes bibliographical references and index.
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Semiconductors.
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182134
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Physical measurements.
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197823
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Shaffner, T. J.
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197821
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320000045718
西方語文圖書區(四樓)
1圖書
一般圖書
QC611.24 R943 1998
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1 records • Pages 1 •
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