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Semiconductor material and device ch...
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Schroder, Dieter K.
Semiconductor material and device characterization /
Record Type:
Language materials, printed : Monograph/item
Title/Author:
Semiconductor material and device characterization /Dieter K. Schroder.
Author:
Schroder, Dieter K.
Published:
New York :Wiley,1998.
Description:
xxiv, 760 p. :ill. ;25 cm.
Notes:
"A Wiley-Interscience publication."
Subject:
Semiconductors.
ISBN:
0471241393 (cloth : alk. paper) :
Semiconductor material and device characterization /
Schroder, Dieter K.
Semiconductor material and device characterization /
Dieter K. Schroder. - 2nd ed. - New York :Wiley,1998. - xxiv, 760 p. :ill. ;25 cm.
"A Wiley-Interscience publication."
Includes bibliographical references and index.
ISBN: 0471241393 (cloth : alk. paper) :NT$3934
LCCN: 97052094 Subjects--Topical Terms:
182134
Semiconductors.
LC Class. No.: QC611 / .S335 1998
Dewey Class. No.: 621.3815/2
Semiconductor material and device characterization /
LDR
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0471241393 (cloth : alk. paper) :
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QC611
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.S335 1998
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Schroder, Dieter K.
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Semiconductor material and device characterization /
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Dieter K. Schroder.
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2nd ed.
260
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New York :
$c
1998.
$b
Wiley,
300
$a
xxiv, 760 p. :
$b
ill. ;
$c
25 cm.
500
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"A Wiley-Interscience publication."
504
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Includes bibliographical references and index.
650
$a
Semiconductors.
$3
182134
650
$a
Semiconductors
$x
Testing.
$3
200391
based on 0 review(s)
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西方語文圖書區(四樓)
Items
1 records • Pages 1 •
1
Inventory Number
Location Name
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Attachments
320000118713
西方語文圖書區(四樓)
1圖書
一般圖書
QC611 S381 1998
一般使用(Normal)
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0
1 records • Pages 1 •
1
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