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Testing for EMC compliance :approaches and techniques /
Record Type:
Electronic resources : Monograph/item
Title/Author:
Testing for EMC compliance :Mark I. Montrose, Edward M. Nakauchi.
Reminder of title:
approaches and techniques /
Author:
Montrose, Mark I.
other author:
Nakauchi, Edward M.
Published:
Hoboken, NJ :John Wiley,2004.
Description:
xviii, 460 p. :ill. ;24 cm.
Subject:
Electromagnetic compatibility.
Online resource:
http://www.loc.gov/catdir/bios/wiley046/2003063488.html
Online resource:
http://www.loc.gov/catdir/description/wiley041/2003063488.html
Online resource:
http://www.loc.gov/catdir/toc/wiley041/2003063488.html
Online resource:
http://libsw.nuk.edu.tw/login?url=http://dx.doi.org/10.1002/047164465X
ISBN:
047143308X (cloth)
Testing for EMC compliance :approaches and techniques /
Montrose, Mark I.
Testing for EMC compliance :
approaches and techniques /[electronic resource] :Mark I. Montrose, Edward M. Nakauchi. - Hoboken, NJ :John Wiley,2004. - xviii, 460 p. :ill. ;24 cm.
Includes bibliographical references (p. 447-451) and index.
Electronic reproduction.
Somerset, New Jersey :
Wiley InterScience,
2004.
Available via World Wide Web.
ISBN: 047143308X (cloth)Subjects--Topical Terms:
184298
Electromagnetic compatibility.
Subjects--Index Terms:
Electromagnetic compatibility
LC Class. No.: TK7867.2 / M66 2004
Dewey Class. No.: 621.382/24
Testing for EMC compliance :approaches and techniques /
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approaches and techniques /
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John Wiley,
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24 cm.
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Includes bibliographical references (p. 447-451) and index.
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Somerset, New Jersey :
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電子館藏
1圖書
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EB TK7867.2 M813 2004
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http://www.loc.gov/catdir/bios/wiley046/2003063488.html
http://www.loc.gov/catdir/description/wiley041/2003063488.html
http://www.loc.gov/catdir/toc/wiley041/2003063488.html
http://libsw.nuk.edu.tw/login?url=http://dx.doi.org/10.1002/047164465X
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