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Applied logistic regression /
Record Type:
Electronic resources : Monograph/item
Title/Author:
Applied logistic regression /David W. Hosmer, Stanley Lemeshow.
Author:
Hosmer, David W.
other author:
Lemeshow, Stanley.
Published:
New York :Wiley,c2000.
Description:
xii, 383 p. :ill. ;25 cm.
Notes:
"A Wiley-Interscience publication."
Series:
Wiley series in probability and statistics.
Subject:
Regression analysis.
Online resource:
http://www.loc.gov/catdir/bios/wiley042/00036843.html
Online resource:
http://www.loc.gov/catdir/description/wiley034/00036843.html
Online resource:
http://www.loc.gov/catdir/toc/onix05/00036843.html
Online resource:
http://libsw.nuk.edu.tw/login?url=http://dx.doi.org/10.1002/0471722146
ISBN:
0471356328 (cloth : alk. paper)
Applied logistic regression /
Hosmer, David W.
Applied logistic regression /
[electronic resource] /David W. Hosmer, Stanley Lemeshow. - 2nd ed. - New York :Wiley,c2000. - xii, 383 p. :ill. ;25 cm. - Wiley series in probability and statistics.Texts and references section.
"A Wiley-Interscience publication."
Includes bibliographical references (p. 352-365) and index.
Electronic reproduction.
Somerset, New Jersey :
Wiley InterScience.
Available via World Wide Web.
ISBN: 0471356328 (cloth : alk. paper)Subjects--Topical Terms:
181872
Regression analysis.
Subjects--Index Terms:
Regression Analysis.
LC Class. No.: QA278.2 / .H67 2000
Dewey Class. No.: 519.5/36
Applied logistic regression /
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000000001865
電子館藏
1圖書
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EB QA278.2 H827 2000
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http://www.loc.gov/catdir/bios/wiley042/00036843.html
http://www.loc.gov/catdir/description/wiley034/00036843.html
http://www.loc.gov/catdir/toc/onix05/00036843.html
http://libsw.nuk.edu.tw/login?url=http://dx.doi.org/10.1002/0471722146
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