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Parts selection and management /
Record Type:
Electronic resources : Monograph/item
Title/Author:
Parts selection and management /edited by Michael G. Pecht.
other author:
Pecht, Michael.
Published:
Hoboken, NJ :John Wiley,2004.
Description:
xxviii, 321 p. ;26 cm.
Subject:
Electronic apparatus and appliancesReliability
Online resource:
http://www.loc.gov/catdir/bios/wiley046/2004040698.html
Online resource:
http://www.loc.gov/catdir/description/wiley041/2004040698.html
Online resource:
http://www.loc.gov/catdir/toc/wiley041/2004040698.html
Online resource:
http://libsw.nuk.edu.tw/login?url=http://dx.doi.org/10.1002/0471723886
ISBN:
0471476056 (cloth)
Parts selection and management /
Parts selection and management /
[electronic resource] /edited by Michael G. Pecht. - Hoboken, NJ :John Wiley,2004. - xxviii, 321 p. ;26 cm.
Includes bibliographical references and index.
Electronic reproduction.
Somerset, New Jersey :
Wiley InterScience.
Available via World Wide Web.
ISBN: 0471476056 (cloth)Subjects--Topical Terms:
225098
Electronic apparatus and appliances
--ReliabilitySubjects--Index Terms:
Electrical and Electronics Engineering.
LC Class. No.: TK7870 / .P343 2004
Dewey Class. No.: 621.381
Parts selection and management /
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edited by Michael G. Pecht.
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[electronic resource] /
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Hoboken, NJ :
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2004.
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John Wiley,
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xxviii, 321 p. ;
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26 cm.
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Includes bibliographical references and index.
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Includes bibliographical references and index.
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Electronic reproduction.
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Somerset, New Jersey :
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Available via World Wide Web.
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Electronic apparatus and appliances
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Reliability
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Testing.
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225098
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Electric apparatus and appliances
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Reliability
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Testing.
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Electrical and Electronics Engineering.
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Pecht, Michael.
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John Wiley & Sons.
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Contributor biographical information
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電子館藏
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Attachments
000000001895
電子館藏
1圖書
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EB TK7870 P364 2004
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1 records • Pages 1 •
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Multimedia
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http://www.loc.gov/catdir/bios/wiley046/2004040698.html
http://www.loc.gov/catdir/description/wiley041/2004040698.html
http://www.loc.gov/catdir/toc/wiley041/2004040698.html
http://libsw.nuk.edu.tw/login?url=http://dx.doi.org/10.1002/0471723886
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