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Coherence properties of extreme ultraviolet/soft X-ray sources

Record Type:	Electronic resources : Monograph/item
Title/Author:	Coherence properties of extreme ultraviolet/soft X-ray sources
Author:	Liu, Yanwei.
Description:	137 p.
Notes:	Chair: David T. Attwood.
Notes:	Source: Dissertation Abstracts International, Volume: 65-02, Section: B, page: 0817.
Contained By:	Dissertation Abstracts International65-02B.
Subject:	Physics, Optics.
Online resource:	http://pqdd.sinica.edu.tw/twdaoapp/servlet/advanced?query=3121582
ISBN:	0496689339

Coherence properties of extreme ultraviolet/soft X-ray sources
Liu, Yanwei.

Coherence properties of extreme ultraviolet/soft X-ray sources [electronic resource] - 137 p.

Chair: David T. Attwood.

Thesis (Ph.D.)--University of California, Berkeley, 2003.

Based on amplified spontaneous emission (ASE) process, EUV/SXR lasers have long been limited to poor spatial coherence. In a series of Young's two-pinhole experiments performed with a capillary discharge 46.9-nm EUV laser, rapid spatial coherence buildup has been observed as a result of refractive anti-guiding (mode selection) in a long and narrow plasma column. It is demonstrated for the first time that essentially full spatial coherence can be obtained from an ASE-based EUV/SXR laser.

ISBN: 0496689339Subjects--Topical Terms:

226935
Physics, Optics.

Coherence properties of extreme ultraviolet/soft X-ray sources
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500 $a Chair: David T. Attwood.
500 $a Source: Dissertation Abstracts International, Volume: 65-02, Section: B, page: 0817.
502 $a Thesis (Ph.D.)--University of California, Berkeley, 2003.
520 # $a Based on amplified spontaneous emission (ASE) process, EUV/SXR lasers have long been limited to poor spatial coherence. In a series of Young's two-pinhole experiments performed with a capillary discharge 46.9-nm EUV laser, rapid spatial coherence buildup has been observed as a result of refractive anti-guiding (mode selection) in a long and narrow plasma column. It is demonstrated for the first time that essentially full spatial coherence can be obtained from an ASE-based EUV/SXR laser.
520 # $a Comparing the sources, undulator radiation has the best spectral coverage, highest average photon flux, and the flexibility to produce desired coherence properties with adequate filtering techniques. The other two sources have made significant progress recently and the experiments reported here have demonstrated their ability to generate coherent radiation with useful photon flux at EUV wavelengths. With their compact sizes, they are likely to play important roles in EUV/SXR science and technology in the coming years.
520 # $a Extreme ultraviolet (EUV) and soft x-ray (SXR) wavelengths, covering the electromagnetic spectrum region of &sim;1--40nm, provide many unique opportunities in a wide range of scientific research and industrial applications. Coherence properties of light sources play critical roles in many of these applications. In this thesis, properties of three currently available coherent EUV/SXR sources: undulators in synchrotron radiation facilities, lasers, and high-order harmonic generation (HHG) sources, are investigated.
520 # $a For undulator radiation, the detailed spectrum and angular distribution in the important central radiation cone are studied. The radiation from a single electron including the effects of limited number of oscillations, and the radiation from an electron beam with finite electron beam size and divergence angle are analytically and numerically calculated.
520 # $a High-order Harmonic Generation is a promising method for generating coherent EUV/SXR radiation by up-shifting intense optical lasers to very high order harmonics. However, due to the strong interaction between the laser field and the atom, coherence of the pump laser field is not always preserved. Through a phase-matched HHG process inside a hollow-core fiber, spatially coherent EUV radiation is generated and verified by two-pinhole interference experiments. Fourier analysis of the two-pinhole interference pattern reveals spectral information characteristic of the broadband radiation, providing a simple yet useful method for absolute wavelength and spectrum measurements at EUV/SXR wavelengths.
590 $a School code: 0028.
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650 # 0 $a Engineering, Electronics and Electrical. $3 226981
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710 0 # $a University of California, Berkeley. $3 212474
773 0 # $g 65-02B. $t Dissertation Abstracts International
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790 1 0 $a Attwood, David T., $e advisor
791 $a Ph.D.
792 $a 2003
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