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Recurrent events data analysis for p...

Nelson, Wayne, (1936-)

Recurrent events data analysis for product repairs, disease recurrences, and other applications /

Record Type:	Language materials, printed : Monograph/item
Title/Author:	Recurrent events data analysis for product repairs, disease recurrences, and other applications /Wayne B. Nelson.
Author:	Nelson, Wayne,
Published:	Philadelphia :Society for Industrial and Applied Mathematics,c2003.
Description:	xi, 151 p. :ill. ;27 cm.
Series:	ASA-SIAM series on statistics and applied probability
Subject:	Failure time data analysis.
Online resource:	http://www.loc.gov/catdir/toc/fy037/2002030864.html
ISBN:	0898715229 (hbk.) :

Recurrent events data analysis for product repairs, disease recurrences, and other applications /
Nelson, Wayne,1936-

Recurrent events data analysis for product repairs, disease recurrences, and other applications /Wayne B. Nelson. - Philadelphia :Society for Industrial and Applied Mathematics,c2003. - xi, 151 p. :ill. ;27 cm. - ASA-SIAM series on statistics and applied probability.

Includes bibliographical references (p. 137-142) and index.

ISBN: 0898715229 (hbk.) :NT2738

LCCN: 2002030864Subjects--Topical Terms:

182533
Failure time data analysis.

LC Class. No.: QA276 / .R465 2003

Dewey Class. No.: 519.5

Recurrent events data analysis for product repairs, disease recurrences, and other applications /
LDR:00834cam 22002174a 450 001 163535
003 DLC
005 20030813112038.0
008 090528s2003 paua b 001 0 eng
010 $a 2002030864
020 $a 0898715229 (hbk.) : $c NT2738
035 $a 00150860
040 $a DLC $c DLC $d DLC
042 $a pcc
050 0 0 $a QA276 $b .R465 2003
082 0 0 $2 21 $a 519.5
100 $a Nelson, Wayne, $d 1936- $3 184627
245 1 0 $a Recurrent events data analysis for product repairs, disease recurrences, and other applications / $c Wayne B. Nelson.
260 $a Philadelphia : $c c2003. $b Society for Industrial and Applied Mathematics,
300 $a xi, 151 p. : $b ill. ; $c 27 cm.
440 0 $a ASA-SIAM series on statistics and applied probability
504 $a Includes bibliographical references (p. 137-142) and index.
650 $a Failure time data analysis. $3 182533
650 $a Survival analysis (Biometry) $3 182534
856 4 1 $3 Table of contents $u http://www.loc.gov/catdir/toc/fy037/2002030864.html $z http://www.loc.gov/catdir/toc/fy037/2002030864.html