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High resolution X-ray diffractometry...
~
Bowen, D. Keith (1940-)
High resolution X-ray diffractometry and topography /
Record Type:
Language materials, printed : Monograph/item
Title/Author:
High resolution X-ray diffractometry and topography /D. Keith Bowen and Brian K. Tanner.
Author:
Bowen, D. Keith
other author:
Tanner, B. K.
Published:
Bristol, PA :Taylor & Francis,c1998.
Description:
x, 252 p. :ill. ;28 cm.
Subject:
X-ray crystallography.
ISBN:
0850667585 (hbk.) :
High resolution X-ray diffractometry and topography /
Bowen, D. Keith1940-
High resolution X-ray diffractometry and topography /
D. Keith Bowen and Brian K. Tanner. - Bristol, PA :Taylor & Francis,c1998. - x, 252 p. :ill. ;28 cm.
Includes bibliographical references and index.
ISBN: 0850667585 (hbk.) :NT3635
LCCN: 98136331 Subjects--Topical Terms:
194759
X-ray crystallography.
LC Class. No.: QD945 / .B683 1998
Dewey Class. No.: 548/.83
High resolution X-ray diffractometry and topography /
LDR
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DLC
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98136331
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0850667585 (hbk.) :
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NT3635
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00151058
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MCM-L
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MCM-L
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DLC
042
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lccopycat
050
0 0
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QD945
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.B683 1998
082
0 0
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21
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548/.83
100
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Bowen, D. Keith
$q
(David Keith),
$d
1940-
$3
439062
245
1 0
$a
High resolution X-ray diffractometry and topography /
$c
D. Keith Bowen and Brian K. Tanner.
260
$a
Bristol, PA :
$a
London ;
$c
c1998.
$b
Taylor & Francis,
300
$a
x, 252 p. :
$b
ill. ;
$c
28 cm.
504
$a
Includes bibliographical references and index.
650
$a
X-ray crystallography.
$3
194759
650
$a
X-rays
$x
Diffraction.
$3
208566
650
$a
Crystals.
$3
194902
700
$a
Tanner, B. K.
$q
(Brian Keith)
$3
439063
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西方語文圖書區(四樓)
Items
1 records • Pages 1 •
1
Inventory Number
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Attachments
320000366569
西方語文圖書區(四樓)
1圖書
一般圖書
QD945 B786 1998
一般使用(Normal)
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0
1 records • Pages 1 •
1
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