High resolution X-ray diffractometry...
Bowen, D. Keith (1940-)

 

  • High resolution X-ray diffractometry and topography /
  • Record Type: Language materials, printed : Monograph/item
    Title/Author: High resolution X-ray diffractometry and topography /D. Keith Bowen and Brian K. Tanner.
    Author: Bowen, D. Keith
    other author: Tanner, B. K.
    Published: Bristol, PA :Taylor & Francis,c1998.
    Description: x, 252 p. :ill. ;28 cm.
    Subject: X-ray crystallography.
    ISBN: 0850667585 (hbk.) :
Items
  • 1 records • Pages 1 •
 
320000366569 西方語文圖書區(四樓) 1圖書 一般圖書 QD945 B786 1998 一般使用(Normal) On shelf 0
  • 1 records • Pages 1 •
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