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Physical principles of electron micr...

Egerton, R. F.

Physical principles of electron microscopy :an introduction to TEM, SEM, and AEM /

Record Type:	Language materials, printed : Monograph/item
Title/Author:	Physical principles of electron microscopy :Ray F. Egerton.
Reminder of title:	an introduction to TEM, SEM, and AEM /
Author:	Egerton, R. F.
Published:	New York, NY :Springer,c2005.
Description:	xii, 202 p. :ill. ;25 cm.
Subject:	Electron microscopy.
Online resource:	http://www.loc.gov/catdir/toc/fy0605/2005924717.html

Physical principles of electron microscopy :an introduction to TEM, SEM, and AEM /
Egerton, R. F.

Physical principles of electron microscopy :an introduction to TEM, SEM, and AEM /Ray F. Egerton. - New York, NY :Springer,c2005. - xii, 202 p. :ill. ;25 cm.

Includes bibliographical references (p. [195]-196) and index.

LCCN: 2005924717Subjects--Topical Terms:

189038
Electron microscopy.

LC Class. No.: QH212.E4 / E354 2005

Physical principles of electron microscopy :an introduction to TEM, SEM, and AEM /
LDR:00802cam _22002177a_450 001 166149
003 DLC
005 20060324121339.0
008 090528s2005 nyua b 001 0 eng d
010 $a 2005924717
020 $z 9780387258000
020 $a 0387258000 (hbk.) : $c NT1934
035 $a 00161961
040 $a OHX $c OHX $d DLC $d IXA $d UAB
042 $a lccopycat
050 0 0 $a QH212.E4 $b E354 2005
072 7 $2 lcco $a QC
100 $a Egerton, R. F. $3 234946
245 1 0 $a Physical principles of electron microscopy : $b an introduction to TEM, SEM, and AEM / $c Ray F. Egerton.
260 $a New York, NY : $c c2005. $b Springer,
300 $a xii, 202 p. : $b ill. ; $c 25 cm.
504 $a Includes bibliographical references (p. [195]-196) and index.
650 $a Electron microscopy. $3 189038
856 4 1 $3 Table of contents $u http://www.loc.gov/catdir/toc/fy0605/2005924717.html $z http://www.loc.gov/catdir/toc/fy0605/2005924717.html