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Semiconductor material and device ch...
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Schroder, Dieter K.
Semiconductor material and device characterization /
Record Type:
Language materials, printed : Monograph/item
Title/Author:
Semiconductor material and device characterization /Dieter K. Schroder.
Author:
Schroder, Dieter K.
Published:
Hoboken, N.J. :IEEE Press ;c2006.
Description:
xv, 779 p. :ill. ;25 cm.
Notes:
"Wiley-Interscience."
Subject:
SemiconductorsTesting.
ISBN:
0471739065 (acid-free paper) :$CNT$1580
Semiconductor material and device characterization /
Schroder, Dieter K.
Semiconductor material and device characterization /
Dieter K. Schroder. - 3rd ed. - Hoboken, N.J. :IEEE Press ;c2006. - xv, 779 p. :ill. ;25 cm.
"Wiley-Interscience."
Includes bibliographical references and index.
ISBN: 0471739065 (acid-free paper) :$CNT$1580
LCCN: 2005048514
Nat. Bib. No.: GBA573304bnbSubjects--Topical Terms:
200391
Semiconductors
--Testing.
LC Class. No.: QC611 / .S335 2006
Dewey Class. No.: 621.3815/2
Semiconductor material and device characterization /
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Dieter K. Schroder.
250
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3rd ed.
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Hoboken, N.J. :
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[Piscataway, NJ] :
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c2006.
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IEEE Press ;
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Wiley,
300
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xv, 779 p. :
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ill. ;
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25 cm.
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"Wiley-Interscience."
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Includes bibliographical references and index.
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Semiconductors
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Testing.
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200391
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Semiconductors.
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182134
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西方語文圖書區(四樓)
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1 records • Pages 1 •
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320000144537
西方語文圖書區(四樓)
1圖書
一般圖書
QC611 S381 2006
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1 records • Pages 1 •
1
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